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Hien Minh Le

Researcher at IBM

Publications -  37
Citations -  195

Hien Minh Le is an academic researcher from IBM. The author has contributed to research in topics: Cache & CPU cache. The author has an hindex of 9, co-authored 37 publications receiving 195 citations. Previous affiliations of Hien Minh Le include Qualcomm & GlobalFoundries.

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Patent

Method and apparatus for implementing power-saving sleep mode in design with multiple clock domains

TL;DR: In this article, a system and a method for implementing a power-saving sleep mode in a synchronous circuit core having multiple clock domains including primary and secondary clock domains is presented.
Journal ArticleDOI

A 1 MB Cache Subsystem Prototype With 1.8 ns Embedded DRAMs in 45 nm SOI CMOS

TL;DR: A single voltage supply, 1 MB cache subsystem prototype that integrates 2 GHz embedded DRAM (eDRAM) macros with on- chip word-line voltage supply generation, a 4 Kb one-time-programmable read-only memory (OTPROM) for redundancy and repair control, and on-chip OTPROM programming voltage generation, clock generation and distribution are described.
Patent

Lateral castout (LCO) of victim cache line in data-invalid state

TL;DR: In this paper, a victim cache line having a data-invalid coherence state is selected for castout from a first lower level cache of a first processing unit by a lateral castout (LCO) command.
Proceedings Article

A 1 MB Cache Subsystem Prototype With 1.8 ns Embedded DRAMs in 45 nm SOI CMOS

TL;DR: In this paper, the authors describe a single voltage supply, 1 MB cache subsystem prototype that integrates 2 GHz embedded DRAM (eDRAM) macros with on-chip word-line voltage supply generation, a 4 Kb one-time-programmable read-only memory (OTPROM) for redundancy and repair control.
Patent

Importation of virtual signals into electronic test equipment to facilitate testing of an electronic component

TL;DR: In this paper, the authors propose a method, system and program product which allows the importation of virtual signals derived from simulation verification testing of an electronic component design into electronic test equipment employed during validation testing of the actual electronic component.