H
Honggon Kim
Researcher at Korea Institute of Science and Technology
Publications - 143
Citations - 4664
Honggon Kim is an academic researcher from Korea Institute of Science and Technology. The author has contributed to research in topics: Catalysis & Ionic liquid. The author has an hindex of 31, co-authored 139 publications receiving 4287 citations. Previous affiliations of Honggon Kim include Kyung Hee University & Kigali Institute of Science and Technology.
Papers
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Journal ArticleDOI
Resistive switching mechanism of TiO2 thin films grown by atomic-layer deposition
Byung Joon Choi,Doo Seok Jeong,Seong Keun Kim,C. Rohde,Seol Choi,J. H. Oh,Honggon Kim,Cheol Seong Hwang,K. Szot,Rainer Waser,B. Reichenberg,S. Tiedke +11 more
TL;DR: In this article, the resistive switching mechanism of 20-to 57-nm-thick TiO2 thin films grown by atomic-layer deposition was studied by currentvoltage measurements and conductive atomic force microscopy.
Journal Article
原子層蒸着で成長したTiO 2 薄膜の抵抗スイッチング機構
Byung Joon Choi,Doo Seok Jeong,Seong Keun Kim,C. Rohde,Seol Choi,J. H. Oh,Honggon Kim,Cheol Seong Hwang,K. Szot,Rainer Waser,B. Reichenberg,S. Tiedke +11 more
Journal ArticleDOI
Zinc–air fuel cell, a potential candidate for alternative energy
Prabal Sapkota,Honggon Kim +1 more
TL;DR: A zinc-air fuel cell (ZAFC) as mentioned in this paper is a potential candidate for an alternative energy generator, which generates electricity by the reaction between oxygen and zinc pallets in a liquid alkaline electrolyte.
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Imidazolium zinc tetrahalide-catalyzed coupling reaction of CO2 and ethylene oxide or propylene oxide
TL;DR: In this article, the catalytic activity of imidazolium zinc tetrahalide was found to be in the order of [ZnBr 4 ] 2− >[ZnCl 4 ] 1− ⪢[Zbr 2 Cl 2 ] 2 − ⫢ [Zbr 4 ] 4−. The turnover frequencies increased with increasing temperature, but remained almost unchanged with the increase of pressure.
Journal ArticleDOI
Solution processed WO3 layer for the replacement of PEDOT:PSS layer in organic photovoltaic cells
Hana Choi,Hana Choi,Bongsoo Kim,Min Jae Ko,Doh Kwon Lee,Honggon Kim,Sung Hyun Kim,Kyungkon Kim,Kyungkon Kim +8 more
TL;DR: In this paper, a solution processed tungsten oxide layer (sWO3) is fully characterized by UV-Vis, XPS, UPS, XRD, AFM, and TEM.