H
Hyungtak Kim
Researcher at Hongik University
Publications - 120
Citations - 2215
Hyungtak Kim is an academic researcher from Hongik University. The author has contributed to research in topics: High-electron-mobility transistor & Threshold voltage. The author has an hindex of 20, co-authored 114 publications receiving 1998 citations. Previous affiliations of Hyungtak Kim include Cornell University & Samsung.
Papers
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Journal ArticleDOI
Undoped AlGaN/GaN HEMTs for microwave power amplification
L.F. Eastman,V. Tilak,Joseph A. Smart,B.M. Green,E.M. Chumbes,Roman Dimitrov,Hyungtak Kim,Oliver Ambacher,Nils Weimann,T. Prunty,M. J. Murphy,William J. Schaff,James R. Shealy +12 more
TL;DR: In this paper, a two-dimensional electron gas (2DEG) is induced using the strong spontaneous and piezoelectric polarization inherent in the AlGaN/GaN structures, and three-dimensional nonlinear thermal simulations are made to determine the temperature rise from heat dissipation in various geometries.
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Influence of barrier thickness on the high-power performance of AlGaN/GaN HEMTs
V. Tilak,B.M. Green,V. Kaper,Hyungtak Kim,T. Prunty,Joseph A. Smart,James R. Shealy,L.F. Eastman +7 more
TL;DR: In this paper, the dependence of current slump in AlGaN/GaN HEMTs on the thickness of the barrier was observed, with the effect being more pronounced in thin barrier samples.
Journal ArticleDOI
Effects of SiN passivation and high-electric field on AlGaN-GaN HFET degradation
TL;DR: In this paper, the effects of silicon nitride (SiN) surface passivation and high-electric field stress (hot electron stress) on the degradation of undoped AlGaN-GaN power HFETs were investigated.
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Photonic high-frequency capacitance-voltage characterization of interface states in metal-oxide-semiconductor capacitors
TL;DR: In this paper, a photonic high-frequency capacitance-voltage (HF C-V) response of metal-oxide semiconductor (MOS) capacitors is reported for the analysis of interface states in MOS systems.
Journal ArticleDOI
High-power broad-band AlGaN/GaN HEMT MMICs on SiC substrates
B.M. Green,V. Tilak,Sungjae Lee,Hyungtak Kim,Joseph A. Smart,Kevin J. Webb,James R. Shealy,L.F. Eastman +7 more
Abstract: Broad-band high-power cascode AlGaN/GaN high electron-mobility transistor monolithic-microwave integrated-circuit (MMIC) amplifiers with high gain and power-added efficiency (PAE) have been fabricated on high-thermal conductivity SiC substrates. A cascode gain cell exhibiting 5 W of power at 8 GHz with a small-signal gain of 19 dB was realized. A nonuniform distributed amplifier (NDA) based on this process was designed, fabricated, and tested, yielding a saturated output power of 3-6 W over a dc-8-GHz bandwidth with an associated PAE of 13%-31%. A broad-band amplifier MMIC using cascode cells in conjunction with a lossy-match input matching network showed a useful operating range of dc-8 GHz with an output power of 5-7.5 W and a PAE of 20%-33.% over this range. The third-order intermodulation products of the amplifiers under two-tone excitation were studied and third-order-intercept values of 42 and 43 dBm (computed using two-tone carrier power) for the lossy match and NDA amplifiers were obtained.