scispace - formally typeset
J

Jian-Hao Chen

Researcher at Peking University

Publications -  90
Citations -  11043

Jian-Hao Chen is an academic researcher from Peking University. The author has contributed to research in topics: Graphene & Scattering. The author has an hindex of 30, co-authored 86 publications receiving 9888 citations. Previous affiliations of Jian-Hao Chen include National Center for Electron Microscopy & Southeast University.

Papers
More filters
Journal ArticleDOI

Unconventional correlated insulator in CrOCl-interfaced Bernal bilayer graphene

TL;DR: In this article , Bernal-stacked bilayer graphene (BLG) atop few-layered CrOCl, exhibiting an over 1 GΩ-resistance insulating state in a widely accessible gate voltage range.
Journal ArticleDOI

Transport evidence of superlattice Dirac cones in graphene monolayer on twisted boron nitride substrate

TL;DR: In this paper , the effects of a twist inside the substrate materials on the unaligned channel materials are explored, and the results reveal the emergence of three pairs of superlattice Dirac points around the pristine Dirac cone, featuring multiple metallic states surrounding the charge neutrality point.
Journal ArticleDOI

In Situ Tuning of Magnetism in Fe3GeTe2 via Argon Ions Irradiation

TL;DR: In this article , the authors report the continuous argon ions irradiation of itinerant Fe3GeTe2, a two-dimensional ferromagnetic metal, with the modification to its transport properties measured in situ.
Journal ArticleDOI

Quantum capacitance properties of the holes in planar germanium

TL;DR: In this article , a high sensitivity quantum capacitance measurement with an improved radio frequency superheterodyne bridge technique for probing the electronic characteristic of Ge/SiGe 2D hole gas (2DHG) at low temperatures and under a perpendicular magnetic field B⊥ was reported.
Proceedings ArticleDOI

Scattering mechanisms in graphene

TL;DR: In this article, the authors performed experiments on ato mically clean graphene on SiO 2 in ultra-high vacuum to determine the chargecarrier scattering rates from charged impurities, lattice defects, and phonons, as well as their dependence on dielectric environment.