J
Jim-Shone Chen
Researcher at AU Optronics
Publications - 13
Citations - 1027
Jim-Shone Chen is an academic researcher from AU Optronics. The author has contributed to research in topics: Thin-film transistor & Threshold voltage. The author has an hindex of 6, co-authored 13 publications receiving 1022 citations. Previous affiliations of Jim-Shone Chen include National Taiwan University & National Sun Yat-sen University.
Papers
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Journal ArticleDOI
15.4: Excellent Performance of Indium‐Oxide‐Based Thin‐Film Transistors by DC Sputtering
Ming-Hsien Lee,Ching-Chieh Shih,Jim-Shone Chen,Wei-Ming Huang,Feng-Yuan Gan,Yi-Chi Shih,Cindy X. Qiu,Ishiang Shih +7 more
TL;DR: In this article, an indium-oxide-based transparent oxide TFT, which the active layer is prepared by DC sputtering, is presented, and the fabricated TOS TFTs show high mobility (37 cm2/V-s), high ON/OFF current ratio and large onstate current.
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Dynamic Bias Instability of p-Channel Polycrystalline-Silicon Thin-Film Transistors Induced by Impact Ionization
Ching-Fang Huang,Hung-Chang Sun,Ying-Jhe Yang,Yen-Ting Chen,Chun-Yuan Ku,Chee-Wee Liu,Yuan-Jun Hsu,Ching-Chieh Shih,Jim-Shone Chen +8 more
TL;DR: The dynamic stress switching of p-channel polycrystalline-silicon (poly-Si) thin-film transistors from full depletion to accumulation bias creates the high electric field near source/drain (S/D) junctions due to the slow formation of the accumulated electrons at the SiO2/poly -Si interface as discussed by the authors.
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Improvement of Memory State Misidentification Caused by Trap-Assisted GIDL Current in a SONOS-TFT Memory Device
Te-Chih Chen,Ting-Chang Chang,Fu-Yen Jian,Shih-Ching Chen,Chia-Sheng Lin,Ming-Hsien Lee,Jim-Shone Chen,Ching-Chieh Shih +7 more
TL;DR: In this article, the authors studied the nonvolatile memory characteristics of polycrystalline-silicon thin-film transistors with a silicon-oxide-nitride-oxide silicon (SONOS) structure.
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Improvement of hot-electron-induced degradation in MOS capacitors by repeated irradiation-then-anneal treatments
Jenn-Gwo Hwu,Jim-Shone Chen +1 more
TL;DR: In this paper, an improvement of the SiO/sub 2/Si interface degradation due to hot-electron injections from silicon by repeated irradiation-then-anneal treatments is described.
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Analysis of Degradation Mechanism in SONOS-TFT Under Hot-Carrier Operation
Te-Chih Chen,Ting-Chang Chang,Shih-Ching Chen,Tien-Yu Hsieh,Fu-Yen Jian,Chia-Sheng Lin,Hung Wei Li,Ming-Hsien Lee,Jim-Shone Chen,Ching-Chieh Shih +9 more
TL;DR: In this paper, the degradation mechanism of polycrystalline silicon thin-film transistors with a siliconoxide-nitride-oxide-silicon structure under off-state stress was investigated.