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Jongsun Kim

Researcher at Hongik University

Publications -  76
Citations -  578

Jongsun Kim is an academic researcher from Hongik University. The author has contributed to research in topics: Jitter & Signal. The author has an hindex of 13, co-authored 72 publications receiving 542 citations. Previous affiliations of Jongsun Kim include University of California & Samsung.

Papers
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Journal ArticleDOI

Advanced RF/baseband interconnect schemes for inter- and intra-ULSI communications

TL;DR: Recent advances in interconnect schemes that promise to meet all of the above system requirements would fundamentally alter the paradigm of ULSI data communications and enable the design of next-generation computing/processing systems.
Journal ArticleDOI

An Energy-Efficient and High-Speed Mobile Memory I/O Interface Using Simultaneous Bi-Directional Dual (Base+RF)-Band Signaling

TL;DR: The proposed amplitude shift keying (ASK) modulator/demodulator with on-chip band-selective transformer obviates a power hungry pre-emphasis and equalization circuitry, revealing a low-power, compact and standard mobile memory-compatible solution.
Journal ArticleDOI

Design of an Interconnect Architecture and Signaling Technology for Parallelism in Communication

TL;DR: A cost-effective interconnect architecture, communication protocol, and signaling technology that exploits parallelism in board-level communication, resulting in shorter latency and higher concurrency on a shared bus or link: the proposed source synchronous CDMA interconnect (SSCDMA-I).
Proceedings ArticleDOI

An RF/baseband FDMA-interconnect transceiver for reconfigurable multiple access chip-to-chip communication

TL;DR: An RF/baseband FDMA-interconnect transceiver, implemented in 0.18 /spl mu/m CMOS, enables reconfigurability and multiple access for multi-I/Os on a shared bus.
Patent

Devices for controlling temperature indications in integrated circuits using adjustable threshold temperatures

TL;DR: In this paper, the first and second voltage signals are about equal (or intersect) when the temperature of the fabricated integrated circuit is about equal to a first temperature, and the intersection of the two signals may indicate a threshold temperature for the operation of the integrated circuit.