Ki Bong Lee

TL;DR: Lee et al. as mentioned in this paper performed X-ray reflectivity experiments performed at the Pohang Light Source (PLS) were supported in part by the Korean Ministry of Science and Technology (MOST) and POSCO.

TL;DR: In this article, the structural evolution of poly(3,4'-oxydiphenylene pyromellitamic acid) precursors is studied by time-resolved synchrotron wide-angle X-ray diffraction and infrared spectroscopy to investigate the relationship between thermal imidization and structural evolution.

Abstract: Growth behaviors of SrTiO3/LaAlO3 films could be varied substantially by controlling terminating atomic layers of the substrates. In a film on the LaO-terminated substrate, strain-induced roughening was observed. In a film on the AlO2-terminated substrate, the first atomic layer of the interface seemed to have lots of defects. However, the stress became quickly relaxed, so a SrTiO3 film could be grown in a layer-by-layer mode after a few monolayers. All these observations could be explained in terms of chemical matching between the atomic layers at the interface.

TL;DR: In this article, the electronic structure of the interface between the ultrathin LiF and the tris-(8-hydroxyquinoline) aluminum (Alq3) layer was investigated using synchrotron x-ray photoelectron emission spectroscopy.

TL;DR: The 3C2 beamline at the Pohang Light Source (PLS) is described in this paper, where a cylindrical Pt-coated silicon mirror intercepts a photon beam up to 3 mrad at a distance of 16 m from a source point and focuses the beam sagittally at the sample position with a magnification of 1:1.