M
Manfred Reiche
Researcher at Max Planck Society
Publications - 178
Citations - 2442
Manfred Reiche is an academic researcher from Max Planck Society. The author has contributed to research in topics: Wafer bonding & Wafer. The author has an hindex of 26, co-authored 178 publications receiving 2357 citations. Previous affiliations of Manfred Reiche include Innovations for High Performance Microelectronics.
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Hydrophobic silicon wafer bonding
TL;DR: In this paper, the authors suggest that hydrogen bonding between Si−F and H−Si across two mating wafers is responsible for room temperature bonding of hydrophobic Si wafer surfaces.
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Glassy dynamics in condensed isolated polymer chains.
Martin Tress,Emmanuel Urandu Mapesa,Wilhelm Kossack,Wycliffe Kiprop Kipnusu,Manfred Reiche,Friedrich Kremer +5 more
TL;DR: The dynamic glass transition of poly(2-vinylpyridine) and found it to be bulk-like; only segments closer than 0.5 nanometer to the substrate were weakly slowed, which paves the way for numerous experiments on the dynamics of isolated molecules.
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Fabrication of monodomain alumina pore arrays with an interpore distance smaller than the lattice constant of the imprint stamp
TL;DR: In this paper, a 4 in. imprint master with silicon technology was developed, which allows imprint pressures as low as 5 kN/cm2 for direct imprint on aluminum, and the authors were able to reduce the interpore distance of the pore array to 60% of the lattice constant of the master stamp.
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Wafer bonding for microsystems technologies
Ulrich Gösele,Ulrich Gösele,Q.-Y. Tong,Q.-Y. Tong,Andreas Schumacher,Gertrud Dr. Kräuter,Manfred Reiche,Andreas Dr. Plößl,P. Kopperschmidt,T.-H. Lee,Won-joo Kim +10 more
TL;DR: In this paper, the authors introduce the different requirements surfaces have to fulfill for successful bonding especially in the case of silicon wafers, and special emphasis is put on understanding the atomistic reactions at the bonding interface.
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Wafer bonding of silicon wafers covered with various surface layers
TL;DR: In this article, the bonding behavior of silicon wafers coated with thermal oxide, plasma-enhanced chemical vapor deposition (PE-CVD) oxide, PE -CVD oxynitride, PE −CVD nitride and low pressure (LP) CVD Nitride are presented.