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Mary E. Vickers

Researcher at University of Cambridge

Publications -  64
Citations -  2246

Mary E. Vickers is an academic researcher from University of Cambridge. The author has contributed to research in topics: Thin film & Quantum well. The author has an hindex of 21, co-authored 63 publications receiving 2056 citations.

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Electron-beam-induced strain within InGaN quantum wells: False indium “cluster” detection in the transmission electron microscope

TL;DR: In this paper, high-resolution TEM images acquired immediately after first irradiating a region of quantum well indicates no gross fluctuations of indium content in the InGaN alloy, during only a brief period of irradiation, inhomogeneous strain is introduced in the material due to electron beam damage.
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Thick lead-free ferroelectric films with high Curie temperatures through nanocomposite-induced strain

TL;DR: The Curie temperature of micrometre-thick films of BaTiO(3) is increased to at least 330 °C, and the tetragonal-to-cubic structural transition temperature to beyond 800 °C is increased, by interspersing stiff, self-assembled vertical columns of Sm(2)O( 3) throughout the film thickness.
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Giant and reversible extrinsic magnetocaloric effects in La0.7Ca0.3MnO3 films due to strain.

TL;DR: This work creates giant and reversible extrinsic magnetocaloric effects in epitaxial films of the ferromagnetic manganite La( 0.7)Ca(0.3)MnO(3) using strain-mediated feedback from BaTiO( 3) substrates near a first-order structural phase transition.
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Threading dislocation reduction in (0001) GaN thin films using SiNx interlayers

TL;DR: In this article, the ability of in situ SiN x interlayers to lower the density of threading dislocations (TDs) has been studied for the growth of c -plane (0, 0,0,1) GaN epilayers on sapphire by organometallic vapour-phase epitaxy (OMVPE).
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Determination of the indium content and layer thicknesses in InGaN/GaN quantum wells by x-ray scattering

TL;DR: In this paper, the indium content and the layer thicknesses in an InGaN epilayer and InGaNs/GaN quantum well structures were determined using high-resolution x-ray diffraction (XRD) using the (002) reflection.