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Mukul Gupta

Researcher at Indian Department of Atomic Energy

Publications -  334
Citations -  3110

Mukul Gupta is an academic researcher from Indian Department of Atomic Energy. The author has contributed to research in topics: Thin film & Amorphous solid. The author has an hindex of 26, co-authored 278 publications receiving 2519 citations. Previous affiliations of Mukul Gupta include ETH Zurich & High Energy Materials Research Laboratory.

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Ambient temperature growth and characterization of stoichiometric NbN thin films

TL;DR: In this paper, the authors reported preparation and characterization of NbNx thin films deposited using a reactive dc magnetron sputtering process at ambient temperature (without any intentional substrate heating).
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Depth selective local coordination in CoFeB thin films probed by XAFS and ToF-SIMS

TL;DR: In this article , the compositional profile and local atomic structure in a Co40Fe40B20 thin film sandwiched between two W layers, have been probed combining time-of-flight secondary ion mass spectrometry (ToF-SIMS) and x-ray absorption fine structure spectroscopy techniques in standing wave geometry.
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Interfacial electronic structure modulated magnetic properties in Ta/CoFeB/Ta multilayers

TL;DR: In this article , a strong correlation between the structural and magnetic properties in as-deposited and annealed Ta (1 nm)/CoFeB (1.5 nm)/TaOx (1nm) trilayer and Ta ( 1 nm)/ CoFeB(1.0 nm) multilayered stack with t = 0.5, 1.
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Experimental Study on Steel Industry Waste as Aggregate in Concrete for a Sustainable Development

TL;DR: In this paper , the authors identify experimentally, sustainable building material solution from waste to ingest in construction field centered on previous effort and literatures, which has an excellent potential to replace the natural coarse aggregate in concrete.
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Investigation of Interfacial and Interdiffusion Study of Ti2N MXene Phase from TiN/Ti multilayers

Mukul Gupta, +1 more
- 01 Sep 2023 - 
TL;DR: In this paper , the root mean square (RMS) roughness of the TiN/Ti multilayer was estimated to be 4.78 nm of pristine samples which increased to ∼5.74 nm after annealing.