scispace - formally typeset
N

N. Owens

Researcher at Freescale Semiconductor

Publications -  12
Citations -  317

N. Owens is an academic researcher from Freescale Semiconductor. The author has contributed to research in topics: Test method & Drop impact. The author has an hindex of 8, co-authored 12 publications receiving 300 citations.

Papers
More filters
Journal ArticleDOI

Stress–Strain Characteristics of Tin-Based Solder Alloys for Drop-Impact Modeling

TL;DR: In this article, a specialized drop-weight test was developed and, together with a conventional mechanical tester, the true stress-strain properties of four solder alloys (sn-37Pb, Sn-1.0Ag-0.1Cu, sn-3.5Ag, and Sn- 3.5Cu) were generated for strain rates in the range from 0.005 s−1 to 300 s− 1.
Journal ArticleDOI

Advances in the drop-impact reliability of solder joints for mobile applications

TL;DR: The research studies in the drop-impact reliability of solder joints in the PCB assemblies intended for mobile applications cover stress–strain characterisation of solders, evaluation of test methods at component and board levels, and investigation of the fatigue characteristics of solder Joints.
Journal ArticleDOI

Stress–strain characteristics of tin-based solder alloys at medium strain rate

TL;DR: Wong et al. as discussed by the authors presented the constitutive properties of four solder alloys (sn37Pb, sn1.0Ag0.1, sn3.5Ag, and Sn3.6Cu) in the range of strain rates between 0.005 s−s−1 and 300 s− s−1.
Journal ArticleDOI

Correlation studies for component level ball impact shear test and board level drop test

TL;DR: The lack of universal correlations between the two test methods has ruled out the use of BIST for evaluating solder joint materials, but BIST is recommended as a test method for quality assurance in view of the strong correlation between the measured parameters and the failure mode.
Journal ArticleDOI

Failure Morphology After Drop Impact Test of Ball Grid Array (BGA) Package With Lead-Free Sn–3.8Ag–0.7Cu and Eutectic SnPb Solders

TL;DR: In this article, high strain-rate drop impact tests were performed on ball grid array (BGA) packages with solder compositions of (in wt%) Sn-3.8Ag-0.7Cu (SnAgCu) and eutectic Sn-37Pb (SnPb).