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Nianduan Lu

Researcher at Chinese Academy of Sciences

Publications -  171
Citations -  2248

Nianduan Lu is an academic researcher from Chinese Academy of Sciences. The author has contributed to research in topics: Nanocrystalline material & Resistive random-access memory. The author has an hindex of 24, co-authored 158 publications receiving 1741 citations. Previous affiliations of Nianduan Lu include Beijing University of Technology & Tsinghua University.

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Eliminating Negative‐SET Behavior by Suppressing Nanofilament Overgrowth in Cation‐Based Memory

TL;DR: Transmission electron microscopy results demonstrate the behavior is caused by the overgrowth of the conductive filament into the Pt electrode, and the CF overgrowth phenomenon is suppressed and the negative-SET behavior is eliminated by inserting an impermeable graphene layer.
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Thermal crosstalk in 3-dimensional RRAM crossbar array

TL;DR: It is revealed that the reset process is dominated by transient thermal effect in 3D RRAM array, and possible methods for alleviating thermal crosstalk effect while further advancing the scaling potential are provided and verified by numerical simulation.
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A review of carrier thermoelectric-transport theory in organic semiconductors

TL;DR: A theoretical description of the thermoelectric Seebeck effect in organic semiconductors is provided and an outlook of the remaining challenges ahead for future theoretical research is provided.
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Thermoelectric Seebeck effect in oxide-based resistive switching memory

TL;DR: It is shown that the small-polaron hopping model can well describe the electronic transport process for all resistance states, although the corresponding temperature-dependent resistance behaviours are contrary.