N
Nicolas Wyrsch
Researcher at École Polytechnique Fédérale de Lausanne
Publications - 152
Citations - 4899
Nicolas Wyrsch is an academic researcher from École Polytechnique Fédérale de Lausanne. The author has contributed to research in topics: Amorphous silicon & Silicon. The author has an hindex of 27, co-authored 140 publications receiving 4503 citations. Previous affiliations of Nicolas Wyrsch include University of Neuchâtel.
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Proceedings Article
Fast and sensitive defect characterization and spectral response measurement of thin film silicon solar structures
Ales Poruba,J. Springer,L. Mullerova,Milan Vanecek,T. Repmann,Bernd Rech,J. Kuendig,Nicolas Wyrsch,Arvind Shah +8 more
TL;DR: In this paper, Fourier Transform Photocurrent Spectroscopy (FTPS) has been used for a fast and sensitive quality assessment of photovoltaic thin films, such as the microcrystalline silicon.
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Influence of design parameters on dark current of vertically integrated a-Si:H diodes.
C. Miazza,Nicolas Wyrsch,G. Choong,S. Dunand,Christophe Ballif,Arvind Shah,Nicolas Blanc,Felix Lustenberger,Rolf Kaufmann,Matthieu Despeisse,Pierre Jarron +10 more
TL;DR: In this article, a systematic study was carried out with test structures on glass and also with a dedicated CMOS test chip designed by CERN, where the authors obtained values of Jdark as low as 20 pA/cm2 at -1 V reverse bias.
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Measurement of surface photovoltage in high-rate deposited a-Si:H films and comparison with photothermal deflection spectroscopy and conductivity data
TL;DR: A series of extensively characterized films of hydrogenated amorphous silicon (a-Si:H) has been used to study influences on and the reliability of the measurement of minority carrier diffusion length by the surface photovoltage method as mentioned in this paper.
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Transient Current Behavior of Vertically Integrated Amorphous Silicon Diodes
TL;DR: In this article, a PVLAB-LAB-ARTICLE-2007-002 Record created on 2009-02-10, modified on 2017-05-10 is used to describe a PV-LAB article.
NEW PARADIGM FOR REAL-TIME MEASUREMENT AND MAPPING IN a-Si:H/uc-Si:H TANDEM DEVICES
Nicolas Wyrsch,O. Haran,A. Kohen,L. Kaplan,Y. Lishzinker,D. Scheiner,S. Dunand,Christophe Ballif +7 more
TL;DR: In this paper, the efficiency loss associated with non-uniformity of large scale monolithically integrated thin-film modules was examined using simulation of amorphous Si modules using a two-dimensional model.