Nicolas Wyrsch

TL;DR: In this paper, the authors investigate the temperature and irradiance dependencies of the power output of silicon solar cell architectures (BSF, PERC, PERT, SHJ) and conclude that maximizing energy production in hot and sunny environments requires not only a high open-circuit voltage, but also a minimal series-to-Ioad-resistance ratio.

TL;DR: In this article, the electron beam induced current (EBIC) technique was used to characterize a 32 lm thick hydrogenated amorphous silicon n-i-p diode deposited on top of an ASIC, containing several channels of active feedback pre-amplifiers with peaking time of 5 ns.

TL;DR: In this article, the electroabsorption spectra for thin films of hydrogenated silicon ranging from amorphous (a-Si:H) to micro-crystalline (micro c-Si-H) structures were reported.

TL;DR: In this paper, the authors evaluate the cost of providing flexibility and compare it with grid reinforcement costs and highlight that using distributed flexibility is more profitable than reinforcing a lowvoltage network until the PV generation covers 145% of the network annual energy demand.

Abstract: Thin-film Si solar module production requires a fast wide area tool for layer characteristic measurement and control. Non-uniformity in layer deposition is expected to induce loss in module power. Simulations of amorphous Si modules using a two-dimensional model have been used to examine the efficiency loss associated with non uniformity of large scale monolithically integrated thin film modules. The results indicate that non uniform deposition significantly lowers the module efficiency, in a magnitude that varies depending on the shape and orientation of the deposition signature relative to the scribe lines. In order to control the deposition process of individual layers in layer stacks in thin-film PV modules a wide area metrology tools has been developed and tested. Example of layers maps obtained during production of Si layers module are shown. Comparisons of layer characteristics obtained using this tool and values obtained by conventional methods are given to validate the tool performances.