P
Patrik Hoffmann
Researcher at Swiss Federal Laboratories for Materials Science and Technology
Publications - 172
Citations - 6603
Patrik Hoffmann is an academic researcher from Swiss Federal Laboratories for Materials Science and Technology. The author has contributed to research in topics: Thin film & Electron beam-induced deposition. The author has an hindex of 40, co-authored 171 publications receiving 6130 citations. Previous affiliations of Patrik Hoffmann include University of Adelaide & Henkel.
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Gas-assisted focused electron beam and ion beam processing and fabrication
TL;DR: A review of the state of the art and level of understanding of direct ion and electron beam fabrication and point out some of the unsolved problems can be found in this article, where the authors also discuss structures that are made for research purposes or for demonstration of the processing capabilities.
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A Snake-Based Approach to Accurate Determination of Both Contact Points and Contact Angles
TL;DR: A new method based on B-spline snakes (active contours) for measuring high-accuracy contact angles with good accuracy and applicability to a variety of images thanks to the high-quality image-interpolation model and an advanced image-energy term.
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Water wetting transition parameters of perfluorinated substrates with periodically distributed flat-top microscale obstacles.
TL;DR: By smoothly depositing water drops on the surfaces, this transition is observed for surface parameter values far from the calculated ones for the thermodynamic transition, therefore offering evidence for the existence of metastable composite states.
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Comparison of mechanically drawn and protection layer chemically etched optical fiber tips
TL;DR: In this paper, near field optical microscope tips are produced by mechanically drawing and by chemical etching of standard single mode fibers and the geometrical shapes and taper angles are compared.
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High-resolution magnetic Co supertips grown by a focused electron beam
TL;DR: In this article, a technique for local growth of high-resolution, high-aspect-ratio magnetic tips and thin adherent magnetic cap coatings on top of batch fabricated scanning force microscopy silicon tips is presented.