P
Pavel Trtik
Researcher at Paul Scherrer Institute
Publications - 124
Citations - 3338
Pavel Trtik is an academic researcher from Paul Scherrer Institute. The author has contributed to research in topics: Neutron imaging & Neutron. The author has an hindex of 26, co-authored 108 publications receiving 2621 citations. Previous affiliations of Pavel Trtik include Swiss Federal Laboratories for Materials Science and Technology & ETH Zurich.
Papers
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Stripe and ring artifact removal with combined wavelet--Fourier filtering.
TL;DR: A fast, powerful and stable filter based on combined wavelet and Fourier analysis for the elimination of horizontal or vertical stripes in images is presented and compared with other types of destriping filters.
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Quantitative x-ray phase nanotomography
TL;DR: In this article, the authors evaluate the quantitativeness of X-ray ptychographic computed tomography (X-PET) with a model sample with a known structure and density, and discuss its sensitivity as a function of resolution.
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On the use of peak-force tapping atomic force microscopy for quantification of the local elastic modulus in hardened cement paste
TL;DR: In this article, a surface of epoxy-impregnated hardened cement paste was investigated using a novel atomic force microscopy (AFM) imaging mode that allows for the quantitative mapping of the local elastic modulus.
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Micro-mechanical properties of cement paste measured by depth-sensing nanoindentation: a preliminary correlation of physical properties with phase type
John Hughes,Pavel Trtik +1 more
TL;DR: In this paper, a simple Portland cement paste with a water/cement ratio of 0.45 without aggregate was prepared and cured for a minimum of 1 month under water, and one sample was subjected to depth-sensing nanoindentation over a regular grid of 50 positions on the sample, each spaced at 50 μm.
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3D imaging of microstructure of spruce wood.
Pavel Trtik,Jürg Dual,Daniel Keunecke,David Mannes,Peter Niemz,P Stähli,Anders Kaestner,Amela Groso,Marco Stampanoni +8 more
TL;DR: Synchrotron radiation phase-contrast X-ray tomographic microscopy was applied to observation and identification of the features of spruce anatomy at the cellular lengthscale and it is suggested that the position of sub-voxel-sized features can be determined indirectly using watershed segmentation.