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Prasanth Sundararajan

Researcher at Nanyang Technological University

Publications -  7
Citations -  123

Prasanth Sundararajan is an academic researcher from Nanyang Technological University. The author has contributed to research in topics: Capacitor & Equivalent series resistance. The author has an hindex of 3, co-authored 4 publications receiving 39 citations.

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Condition Monitoring of DC-Link Capacitors Using Goertzel Algorithm for Failure Precursor Parameter and Temperature Estimation

TL;DR: This article tackles the practical difficulties associated with capacitor core-temperature estimation using the capacitance and demonstrates a successful implementation strategy for applying this method in power converters to estimate core temperature online.
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Online Condition Monitoring System for DC-Link Capacitor in Industrial Power Converters

TL;DR: The condition monitoring system proposed in this paper is based on the online estimation of the capacitor's equivalent series resistance using the switching frequency components of the dc-link capacitor voltage and current, and is adapted for the condition monitoring of capacitors in industrial power converters.
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Comparative Analysis of IGBT Parameters Variation Under Different Accelerated Aging Tests

TL;DR: In this article, an experimental investigation of active dc, PWM power cycling and passive thermal cycling approaches on 1.2-kV 50-A fast trench insulated gate bipolar junction transistor (IGBT) devices is presented.
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Short Circuit Detection and Fault Current Limiting Method for IGBTs

TL;DR: The fault detection circuit is based on monitoring the collector-emitter voltage using external collector capacitor, and the protection circuits are based on softly turning off the gate voltage using a current diode, which reduces power dissipation, temperature rise and prevents damage of the drive system.

Reliability Assessment of Power Semiconductor Devices for a 13-Level Boost Inverter Topology

TL;DR: In this paper , a 13-level boost inverter topology has been analyzed and the test results are presented and discussed in terms of open-circuit fault, short-circuits fault, power loss, and thermal analysis.