R
Rene A. Lujan
Researcher at Xerox
Publications - 32
Citations - 844
Rene A. Lujan is an academic researcher from Xerox. The author has contributed to research in topics: Thin-film transistor & Amorphous silicon. The author has an hindex of 14, co-authored 32 publications receiving 825 citations.
Papers
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Journal ArticleDOI
All jet-printed polymer thin-film transistor active-matrix backplanes
Ana Claudia Arias,Steve E. Ready,Rene A. Lujan,William S. Wong,K. E. Paul,Alberto Salleo,Michael L. Chabinyc,Raj B. Apte,Robert A. Street,Yiliang Wu,Ping Liu,Beng S. Ong +11 more
TL;DR: In this paper, the authors reported the fabrication of TFT backplanes by using jet printing as the only patterning method, and they used a regioregular polythiophene, poly[5,5′-bis(3-dodecyl-2-thienyl)-2,2′-bithiophene; (PQT-12) is deposited by inkjet printing and exhibits average TFT mobility of 0.06cm2∕Vs, on/off ratios of 106, and minimal bias stress.
Journal ArticleDOI
Reflectivity of disordered silicon nanowires
TL;DR: In this article, a simple model is used to estimate that the incident photon interacts with up to 20 nanowires before being reflected and a thin coating of hydrogenated amorphous silicon enhances the nanowire absorption.
Patent
Low temperature process for laser dehydrogenation and crystallization of amorphous silicon
TL;DR: In this article, a low temperature process for dehydrogenating amorphous silicon using lasers is described, where irradiation at the various energy densities can result in the formation of polysilicon due to melting of the ammorphous silicon layer.
Journal ArticleDOI
Grain growth in laser dehydrogenated and crystallized polycrystalline silicon for thin film transistors
P. Mei,J. B. Boyce,M. Hack,Rene A. Lujan,Steve Ready,David K. Fork,Richard I. Johnson,G. B. Anderson +7 more
TL;DR: In this paper, a dual dielectric gate insulator has been developed for bottom-gate thin-film transistors to simplify fabrication of both high quality amorphous and polycrystalline thin film transistors on the same glass substrate.
Journal ArticleDOI
High resolution X-ray imaging using amorphous silicon flat-panel arrays
Jeffrey T. Rahn,Francesco Lemmi,J.P. Lu,P. Mei,Raj B. Apte,Robert Street,Rene A. Lujan,Richard L. Weisfield,J.A. Heanue +8 more
TL;DR: In this paper, the geometry of the pixel sensor has been extended from a mesa isolated structure into a continuous layer above the readout structures of the array, which improves sensitivity to visible light and to X-ray illumination when coupled with a conversion phosphor.