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Steve E. Ready

Researcher at Xerox

Publications -  23
Citations -  880

Steve E. Ready is an academic researcher from Xerox. The author has contributed to research in topics: X-ray detector & Thin-film transistor. The author has an hindex of 14, co-authored 23 publications receiving 844 citations.

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Journal ArticleDOI

All jet-printed polymer thin-film transistor active-matrix backplanes

TL;DR: In this paper, the authors reported the fabrication of TFT backplanes by using jet printing as the only patterning method, and they used a regioregular polythiophene, poly[5,5′-bis(3-dodecyl-2-thienyl)-2,2′-bithiophene; (PQT-12) is deposited by inkjet printing and exhibits average TFT mobility of 0.06cm2∕Vs, on/off ratios of 106, and minimal bias stress.
Journal ArticleDOI

Comparison of PbI2 and HgI2 for direct detection active matrix x-ray image sensors

TL;DR: In this paper, the factors determining the x-ray sensitivity of HgI2 and PbI2 as direct detector materials for large area matrix addressed X-ray image sensors are described, along with a model to explain their different properties.
Journal ArticleDOI

Laser dehydrogenation/crystallization of plasma‐enhanced chemical vapor deposited amorphous silicon for hybrid thin film transistors

TL;DR: In this article, a low temperature process for laser dehydrogenation and crystallization of hydrogenated amorphous silicon (a•Si:H) has been developed, which removes hydrogen by laser irradiations at three energy steps.
Proceedings ArticleDOI

High-resolution direct-detection x-ray imagers

TL;DR: In this paper, a-Si direct detection x-ray image sensors with polycrystalline PbI2, and more recently with HgI2 were reported, and the performance of the detectors were investigated.
Proceedings ArticleDOI

Comparative study of Pbl 2 and Hgl 2 as direct detector materials for high-resolution x-ray image sensors

TL;DR: In this article, a model for signal generation in terms of the semiconducting properties of the materials is presented, and the authors obtain zero spatial frequency DQE values of 0.7 - 0.8 with PbI(subscript 24/ under low energy exposure conditions.