S
Steve E. Ready
Researcher at Xerox
Publications - 23
Citations - 880
Steve E. Ready is an academic researcher from Xerox. The author has contributed to research in topics: X-ray detector & Thin-film transistor. The author has an hindex of 14, co-authored 23 publications receiving 844 citations.
Papers
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Journal ArticleDOI
All jet-printed polymer thin-film transistor active-matrix backplanes
Ana Claudia Arias,Steve E. Ready,Rene A. Lujan,William S. Wong,K. E. Paul,Alberto Salleo,Michael L. Chabinyc,Raj B. Apte,Robert A. Street,Yiliang Wu,Ping Liu,Beng S. Ong +11 more
TL;DR: In this paper, the authors reported the fabrication of TFT backplanes by using jet printing as the only patterning method, and they used a regioregular polythiophene, poly[5,5′-bis(3-dodecyl-2-thienyl)-2,2′-bithiophene; (PQT-12) is deposited by inkjet printing and exhibits average TFT mobility of 0.06cm2∕Vs, on/off ratios of 106, and minimal bias stress.
Journal ArticleDOI
Comparison of PbI2 and HgI2 for direct detection active matrix x-ray image sensors
Robert Street,Steve E. Ready,K. Van Schuylenbergh,Jackson Ho,J. B. Boyce,P. Nylen,Kanai S. Shah,L. Melekhov,Haim Hermon +8 more
TL;DR: In this paper, the factors determining the x-ray sensitivity of HgI2 and PbI2 as direct detector materials for large area matrix addressed X-ray image sensors are described, along with a model to explain their different properties.
Journal ArticleDOI
Laser dehydrogenation/crystallization of plasma‐enhanced chemical vapor deposited amorphous silicon for hybrid thin film transistors
Ping Mei,J. B. Boyce,M. Hack,R. A. Lujan,Richard I. Johnson,G. B. Anderson,David K. Fork,Steve E. Ready +7 more
TL;DR: In this article, a low temperature process for laser dehydrogenation and crystallization of hydrogenated amorphous silicon (a•Si:H) has been developed, which removes hydrogen by laser irradiations at three energy steps.
Proceedings ArticleDOI
High-resolution direct-detection x-ray imagers
Robert A. Street,Steve E. Ready,Jeffrey T. Rahn,Marcelo Mulato,Kanai S. Shah,Paul R. Bennett,Ping Mei,Jeng-Ping Lu,Raj B. Apte,Jackson Ho,Koenraad F. Van Schuylenbergh,Francesco Lemmi,James B. Boyce,Per Nylén,Michael M. Schieber,Haim Hermon +15 more
TL;DR: In this paper, a-Si direct detection x-ray image sensors with polycrystalline PbI2, and more recently with HgI2 were reported, and the performance of the detectors were investigated.
Proceedings ArticleDOI
Comparative study of Pbl 2 and Hgl 2 as direct detector materials for high-resolution x-ray image sensors
Robert A. Street,Marcelo Mulato,Michael M. Schieber,Haim Hermon,Kanai S. Shah,Paul R. Bennett,Yuri Dmitryev,Jackson Ho,Rachel Lau,Evgenie Meerson,Steve E. Ready,Benjamin Reisman,Y. Sado,Koenraad F. Van Schuylenbergh,Alexander I. Vilensky,A. Zuck +15 more
TL;DR: In this article, a model for signal generation in terms of the semiconducting properties of the materials is presented, and the authors obtain zero spatial frequency DQE values of 0.7 - 0.8 with PbI(subscript 24/ under low energy exposure conditions.