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Ricardo Legarda-Saenz
Researcher at Universidad Autónoma de Yucatán
Publications - 41
Citations - 543
Ricardo Legarda-Saenz is an academic researcher from Universidad Autónoma de Yucatán. The author has contributed to research in topics: Wavefront & Phase retrieval. The author has an hindex of 10, co-authored 36 publications receiving 485 citations. Previous affiliations of Ricardo Legarda-Saenz include Centro de Investigaciones en Optica & Bremen Institute for Applied Beam Technology.
Papers
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Accurate procedure for the calibration of a structured light system
TL;DR: The proposed procedure is based on defining a unique coordinate system for both devices in the structured light system, and thus, a rigidity constraint is introduced into the transformation process, used to derivate a simple function for the simultaneous estimation of the parameters.
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Color-fringe pattern profilometry using a generalized phase-shifting algorithm.
TL;DR: The simulations and experimental results show that the proposed generalized phase-shifting algorithm with arbitrary phase-shift values can significantly reduce the influence of the color crosstalk.
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Improvement of the regularized phase tracking technique for the processing of nonnormalized fringe patterns.
TL;DR: A new improvement in the RPT technique is presented, which consists in the addition of one term that models the fringe-pattern modulation that can be used for the demodulation of nonnormalized fringe patterns.
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Fast phase recovery from a single closed-fringe pattern
TL;DR: A new framework for phase recovery from a single fringe pattern with closed fringes is proposed, which reduces the closed-fringe-analysis problem to that of choosing the better phase between the two oriented computed phases and then of estimating the local sign.
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Robust wave-front estimation from multiple directional derivatives.
TL;DR: A quadratic cost functional for computing an estimate of a wave front from multiple directional derivatives is presented, which is robust to noise and specially suited for moiré deflectometry, Ronchi testing, and lateral shearing interferometry.