Rob Delhez

TL;DR: In this paper, a detailed analysis of line profiles in terms of Fourier coefficients is presented, and the subsequent steps of measurement, data correction and evaluation are elucidated; alternatives are indicated; and it is expected that line profile analysis will become an automated routine-like analytical method soon, since the tools are available: non-expensive computers, error calculations and commercially available software.

TL;DR: The use of the Fourier, variance and related methods in general requires that the diffraction lines are well resolved and it is thus restricted to materials with high symmetry or which exhibit a high degree of preferred orientation as discussed by the authors.

TL;DR: In this paper, a revision of the original description by Warren [X-ray Diffraction, (1969), pp. 275-298] of the intensity distribution of powder-pattern reflections from f.c. metal samples containing stacking and twin faults was presented.

TL;DR: In this article, the metastable silicon solubility of aluminium-silicon alloys with compositions in the range 0 at% to 33.9 at % Si were determined from lattice parameter and differential scanning calorimetry (DSC) data.

TL;DR: In this paper, the effect of an in situ ultrasonic treatment on the microstructure of low carbon steel (Fe 0.051C-0.002Si−0.045Al) under tensile deformation is reported.