Profile analysis for microcrystalline properties by the Fourier and other methods
TLDR
The use of the Fourier, variance and related methods in general requires that the diffraction lines are well resolved and it is thus restricted to materials with high symmetry or which exhibit a high degree of preferred orientation as discussed by the authors.Abstract:
In the 1960s the Fourier and variance methods superseded the use of the FWHM and integral breadth in detailed studies of microcrystalline properties. Provided that due allowance is made in the analysis for systematic errors, particularly the effects of truncation of diffraction line profiles at a finite range, these remain the best methods for characterising crystallite size and shape, microstrains and other imperfections in cases where accuracy is important. However, the application of the Fourier, variance and related methods in general requires that the diffraction lines are well resolved and it is thus restricted to materials with high symmetry or which exhibit a high degree of preferred orientation. Most materials, on the other hand, including many of technological importance, have complex patterns with severe overlapping of peaks. The introduction of pattern-decomposition methods, whereby a suitable model is fitted to the total diffraction pattern to give profile parameters for individual lines, means that microcrystalline properties can now be studied for any crystalline material or mixture of substances. The use of the FWHM and integral breadth has been given a new lease of life; though the information is less detailed than is given by the Fourier and variance methods and systematic errors are in general greater, self-consistent estimates of crystallite size and microstrains are obtained.read more
Citations
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The “state of the art” of the diffraction analysis of crystallite size and lattice strain.
TL;DR: In this article, the authors address both old, but "renovated" methods and new methods for diffraction line-profile analysis, focusing on distinct anisotropic linebroadening effects, as due to the type, orientation and distribution of dislocations and minute compositional variation.
Journal ArticleDOI
Luminescent properties and lattice defects correlation on zinc oxide
TL;DR: In this article, a correlation among luminescence properties of ZnO, obtained from zinc hydroxycarbonate, and crystalline lattice defects, microstrain, as function of thermal treatment is reported.
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Microstructure evolution and thermal properties in nanocrystalline Cu during mechanical attrition
Yonghao Zhao,Kathy Lu,K. Zhang +2 more
TL;DR: In this paper, the microstructural evolution and thermal properties of nanocrystalline (nc) Cu during mechanical attrition were investigated by using quantitative x-ray-diffraction and thermal analysis techniques.
Journal ArticleDOI
Microstructure evolution and thermal properties in nanocrystalline Fe during mechanical attrition
Yue Zhao,Hongwei Sheng,Kathy Lu +2 more
TL;DR: In this article, the microstructural evolution and thermal properties of nanocrystalline (nc) Fe during mechanical attrition were investigated by using quantitative X-ray diffraction and thermal analysis techniques.
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Structural and optical properties of annealed CdO thin films prepared by spray pyrolysis
O. Vigil,Francisco Cruz,Arturo Morales-Acevedo,Gerardo Contreras-Puente,Lı́dice Vaillant,Guillermo Santana +5 more
TL;DR: In this paper, structural, optical and electrical properties of CdO films as a function of thermal annealing are reported, showing that the optical band-gap shows a dependence with the inverse of the squared crystallite size, suggesting that electron confinement is an important effect.
References
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X-ray diffraction procedures for polycrystalline and amorphous materials
Harold P. Klug,Leroy Alexander +1 more