Robert Hoppe

TL;DR: In this article, the authors carried out a ptychographic scanning coherent diffraction imaging experiment on a test object in order to characterize the hard x-ray nanobeam in a scanning X-ray microscope and obtained a detailed quantitative picture of the complex wave field in the nanofocus with high spatial resolution and dynamic range.

TL;DR: This article demonstrates focusing of hard X-ray FEL pulses to 125 nm using refractive x-ray optics, and reports on the full characterization of a nanofocused XFEL beam by ptychographic imaging, giving access to the complex wave field in the nanofocus.

TL;DR: In this paper, the authors demonstrate x-ray scanning coherent diffraction microscopy (ptychography) with 10nm spatial resolution, clearly exceeding the resolution limits of conventional hard X-ray microscopy, showing that the spatial resolution in a ptychogram is dependent on the shape (structure factor) of a feature and can vary for different features in the object.

TL;DR: This study demonstrates that this morphology indeed provides the highest white retroreflection at the minimum use of material, and hence weight for the organism, and changes any of the network parameters either increases the weight, increases the thickness, or reduces reflectivity, providing clear evidence for the evolutionary optimization of this morphology.

TL;DR: This article accesses a new field of science by measuring quantitatively the local bulk properties and dynamics of matter under extreme conditions, in this case by using the short XFEL pulse to image an elastic compression wave in diamond.