Journal ArticleDOI
Hard x-ray nanobeam characterization by coherent diffraction microscopy
A. Schropp,P. Boye,J. M. Feldkamp,Robert Hoppe,Jens Patommel,D. Samberg,Sandra Stephan,Klaus Giewekemeyer,Robin N. Wilke,Tim Salditt,J. Gulden,Adrian P. Mancuso,Ivan A. Vartanyants,E. Weckert,S. Schöder,M. Burghammer,Christian G. Schroer +16 more
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TLDR
In this article, the authors carried out a ptychographic scanning coherent diffraction imaging experiment on a test object in order to characterize the hard x-ray nanobeam in a scanning X-ray microscope and obtained a detailed quantitative picture of the complex wave field in the nanofocus with high spatial resolution and dynamic range.Abstract:
We have carried out a ptychographic scanning coherent diffraction imaging experiment on a test object in order to characterize the hard x-ray nanobeam in a scanning x-ray microscope. In addition to a high resolution image of the test object, a detailed quantitative picture of the complex wave field in the nanofocus is obtained with high spatial resolution and dynamic range. Both are the result of high statistics due to the large number of diffraction patterns. The method yields a complete description of the focus, is robust against inaccuracies in sample positioning, and requires no particular shape or prior knowledge of the test object.read more
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Journal ArticleDOI
Ptychographic X-ray computed tomography at the nanoscale
Martin Dierolf,Andreas Menzel,Pierre Thibault,Philipp Schneider,Cameron M. Kewish,Roger Wepf,Oliver Bunk,Franz Pfeiffer +7 more
TL;DR: An X-ray computed tomography technique that generates quantitative high-contrast three-dimensional electron density maps from phase contrast information without reverting to assumptions of a weak phase object or negligible absorption is described.
Journal ArticleDOI
X-ray ptychography
TL;DR: X-ray ptychographic microscopy combines the advantages of raster scanning X-ray microscopy with the more recently developed techniques of coherent diffraction imaging as mentioned in this paper, and offers in principle wavelength-limited resolution, as well as stable access and solution to the phase problem.
Journal ArticleDOI
Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging
TL;DR: This work demonstrates a form of diffractive imaging that unshackles the image formation process from the constraints of electron optics, improving resolution over that of the lens used by a factor of five and showing for the first time that it is possible to recover the complex exit wave at atomic resolution.
Journal ArticleDOI
An annealing algorithm to correct positioning errors in ptychography.
TL;DR: A computationally efficient extension of the 'ePIE' ptychographic reconstruction algorithm for correcting positioning errors retrospectively that can correct positioning errors tens of times larger than the pixel size in the resulting image is presented.
Journal ArticleDOI
Optical ptychography: a practical implementation with useful resolution
TL;DR: A lensless, quantitative phase microscope with a wide field of view and a useful resolution that uses the recently reported coherent diffractive imaging technique of ptychography to generate images from recorded diffraction patterns.
References
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Journal ArticleDOI
High-Resolution Scanning X-ray Diffraction Microscopy
Pierre Thibault,Martin Dierolf,Andreas Menzel,Oliver Bunk,Christian David,Franz Pfeiffer,Franz Pfeiffer +6 more
TL;DR: A ptychographic imaging method is demonstrated that bridges the gap between CDI and STXM by measuring complete diffraction patterns at each point of a STXM scan.
Journal ArticleDOI
An improved ptychographical phase retrieval algorithm for diffractive imaging.
Andrew Maiden,John M. Rodenburg +1 more
TL;DR: The PIE is extended so that the requirement for an accurate model of the illumination function is removed and the technique has been shown to be robust to detector noise and to converge considerably faster than support-based phase retrieval methods.
Journal ArticleDOI
Soft X-ray microscopy at a spatial resolution better than 15 nm
Weilun Chao,Weilun Chao,Bruce Harteneck,J. Alexander Liddle,Erik H. Anderson,David Attwood,David Attwood +6 more
TL;DR: The achievement of sub-15-nm spatial resolution with a soft X-ray microscope—and a clear path to below 10 nm—using an overlay technique for zone plate fabrication is reported.
Journal ArticleDOI
Hard-X-Ray Lensless Imaging of Extended Objects
John M. Rodenburg,A C Hurst,A. G. Cullis,B. R. Dobson,Franz Pfeiffer,Oliver Bunk,Christian David,Konstantins Jefimovs,Ian Johnson +8 more
TL;DR: A hard-x-ray microscope that does not use a lens and is not limited to a small field of view or an object of finite size is demonstrated, which has revolutionary implications for x-ray imaging of all classes of specimen.
Journal ArticleDOI
A phase retrieval algorithm for shifting illumination
TL;DR: In this paper, a method of iterative phase retrieval that uses measured intensities in the diffraction plane to solve the phase problem in a way that bypasses the problem of lens aberration was proposed.
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