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S

S. Heiroth

Researcher at Paul Scherrer Institute

Publications -  17
Citations -  677

S. Heiroth is an academic researcher from Paul Scherrer Institute. The author has contributed to research in topics: Pulsed laser deposition & Thin film. The author has an hindex of 13, co-authored 17 publications receiving 619 citations.

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Saturable and reverse saturable absorption in silver nanodots at 532 nm using picosecond laser pulses

TL;DR: Saturable absorption and reverse saturable absorption (RSA) at 532 nm were observed in Ag nanodots prepared by pulsed laser deposition as discussed by the authors, and the recovery time of these nonlinear processes was measured by a degenerate pump-probe experiment.
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Optical and mechanical properties of amorphous and crystalline yttria-stabilized zirconia thin films prepared by pulsed laser deposition

TL;DR: In this paper, the dependence of the mechanical and optical properties on the film microstructure and chemical composition was investigated by nanoindentation experiments and transmission spectrophotometry.
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Crystallization and grain growth characteristics of yttria-stabilized zirconia thin films grown by pulsed laser deposition

TL;DR: In this paper, a comprehensive investigation of the crystallization kinetics and microstructural evolution upon thermal post-annealing of amorphous 200-nm and 1.2-μm thin films of 8-mol% yttria-stabilized zirconia grown by pulsed laser deposition (PLD) using ex-and in-situ X-ray diffraction, Raman spectroscopy, and electron microscopy techniques is presented.
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Yttria-stabilized zirconia thin films by pulsed laser deposition: Microstructural and compositional control

TL;DR: In this paper, the ns-laser ablation characteristics of tetragonal 3YSZ versus cubic 8YSZ have been investigated to minimize a transfer of particulates in the pulsed laser deposition process.
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Laser ablation characteristics of yttria-doped zirconia in the nanosecond and femtosecond regimes

TL;DR: In this article, the laser ablation characteristics of yttria-stabilized zirconia (YSZ) have been investigated as a function of the target microstructure and dopant level for different nanosecond- [ArF, KrF, and XeCl excimers; Nd:YAG (yttrium aluminum garnet) (fourth harmonic)] and femtosecondlaser sources [Ti:sapphire (fundamental and third harmonic)].