S
Seol Choi
Researcher at Seoul National University
Publications - 22
Citations - 2851
Seol Choi is an academic researcher from Seoul National University. The author has contributed to research in topics: Thin film & Chemical vapor deposition. The author has an hindex of 15, co-authored 22 publications receiving 2730 citations. Previous affiliations of Seol Choi include Polytechnic University of Milan.
Papers
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Journal ArticleDOI
Resistive switching mechanism of TiO2 thin films grown by atomic-layer deposition
Byung Joon Choi,Doo Seok Jeong,Seong Keun Kim,C. Rohde,Seol Choi,J. H. Oh,Honggon Kim,Cheol Seong Hwang,K. Szot,Rainer Waser,B. Reichenberg,S. Tiedke +11 more
TL;DR: In this article, the resistive switching mechanism of 20-to 57-nm-thick TiO2 thin films grown by atomic-layer deposition was studied by currentvoltage measurements and conductive atomic force microscopy.
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Anode-interface localized filamentary mechanism in resistive switching of TiO2 thin films
TL;DR: In this paper, the filamentary resistance switching mechanism of a Pt∕40nm TiO2∕Pt capacitor structure in voltage sweep mode was investigated and it was unambiguously found that the conducting filaments propagate from the cathode interface and that the resistance switching is induced by the rupture and recovery of the filaments in the localized region (3-10nm thick) near the anode.
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Identification of a determining parameter for resistive switching of TiO2 thin films
Christina Rohde,Christina Rohde,Byung Joon Choi,Doo Seok Jeong,Seol Choi,Jin Shi Zhao,Cheol Seong Hwang +6 more
TL;DR: In this paper, an electric-pulse-induced resistive switching of 43nm thick TiO2 thin films grown by metalorganic chemical vapor deposition was studied by currentvoltage (I-V) and constant voltage-time measurements.
Journal Article
原子層蒸着で成長したTiO 2 薄膜の抵抗スイッチング機構
Byung Joon Choi,Doo Seok Jeong,Seong Keun Kim,C. Rohde,Seol Choi,J. H. Oh,Honggon Kim,Cheol Seong Hwang,K. Szot,Rainer Waser,B. Reichenberg,S. Tiedke +11 more
Journal ArticleDOI
Resistive Switching in Pt ∕ Al2O3 ∕ TiO2 ∕ Ru Stacked Structures
TL;DR: In this paper, the electric-pulse induced resistive switching properties of TiO 2, Al 2 O 3, Al O 3 /TiO 2 /Al O 3 thin films were studied by currentvoltage (I-V) measurements using Pt/insulator/Ru structures and conductive atomic force microscopy.