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Shinobu Fujita
Researcher at Toshiba
Publications - 130
Citations - 2212
Shinobu Fujita is an academic researcher from Toshiba. The author has contributed to research in topics: Non-volatile memory & Magnetoresistive random-access memory. The author has an hindex of 23, co-authored 130 publications receiving 2138 citations. Previous affiliations of Shinobu Fujita include Stanford University.
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Journal ArticleDOI
A 1 GHz integrated circuit with carbon nanotube interconnects and silicon transistors.
TL;DR: The fabrication of the first stand-alone integrated circuit combining silicon transistors and individual carbon nanotube interconnect wires on the same chip operating above 1 GHz is reported, paving the way for future multi-GHz nanoelectronics.
Proceedings ArticleDOI
A low-overhead fault tolerance scheme for TSV-based 3D network on chip links
TL;DR: In this article, a defect-tolerance technique for TSVs-based multi-bit links through an efficient and effective use of redundancy is presented, which is ideally suited for three-dimensional network-on-chip (NoC) links.
Journal ArticleDOI
Fully Integrated Graphene and Carbon Nanotube Interconnects for Gigahertz High-Speed CMOS Electronics
Xiangyu Chen,Deji Akinwande,Kyeong-Jae Lee,G.F. Close,Shinichi Yasuda,Bipul C. Paul,Shinobu Fujita,Jing Kong,Hon-Sum Philip Wong +8 more
TL;DR: In this article, the performance of high-speed on-chip graphene and MWCNT interconnects is evaluated using a low-swing signaling technique, which has been applied to improve the speed of the interconnect up to 30%.
Journal ArticleDOI
Impact of a Process Variation on Nanowire and Nanotube Device Performance
TL;DR: In this paper, the authors present an in-depth analysis of the nanowire and nanotube device performance under process variability and show that nanowires/nanotubes are significantly less sensitive to many process parameter variations due to their inherent device structures and geometric properties.
Proceedings ArticleDOI
7.5 A 3.3ns-access-time 71.2μW/MHz 1Mb embedded STT-MRAM using physically eliminated read-disturb scheme and normally-off memory architecture
Hiroki Noguchi,Kazutaka Ikegami,Keiichi Kushida,Keiko Abe,Shogo Itai,Satoshi Takaya,Naoharu Shimomura,Junichi Ito,Atsushi Kawasumi,Hiroyuki Hara,Shinobu Fujita +10 more
TL;DR: STT-MRAM circuit designs are presented: a short read-pulse generator with small overhead using hierarchical bitline for eliminating read disturbance, a charge-optimization scheme to avoid excessive active charging/discharging power, and ultra-fast power gating and power-on adaptive to RAM status for reducing leakage power.