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Shinobu Fujita

Researcher at Toshiba

Publications -  130
Citations -  2212

Shinobu Fujita is an academic researcher from Toshiba. The author has contributed to research in topics: Non-volatile memory & Magnetoresistive random-access memory. The author has an hindex of 23, co-authored 130 publications receiving 2138 citations. Previous affiliations of Shinobu Fujita include Stanford University.

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Journal ArticleDOI

A 1 GHz integrated circuit with carbon nanotube interconnects and silicon transistors.

TL;DR: The fabrication of the first stand-alone integrated circuit combining silicon transistors and individual carbon nanotube interconnect wires on the same chip operating above 1 GHz is reported, paving the way for future multi-GHz nanoelectronics.
Proceedings ArticleDOI

A low-overhead fault tolerance scheme for TSV-based 3D network on chip links

TL;DR: In this article, a defect-tolerance technique for TSVs-based multi-bit links through an efficient and effective use of redundancy is presented, which is ideally suited for three-dimensional network-on-chip (NoC) links.
Journal ArticleDOI

Fully Integrated Graphene and Carbon Nanotube Interconnects for Gigahertz High-Speed CMOS Electronics

TL;DR: In this article, the performance of high-speed on-chip graphene and MWCNT interconnects is evaluated using a low-swing signaling technique, which has been applied to improve the speed of the interconnect up to 30%.
Journal ArticleDOI

Impact of a Process Variation on Nanowire and Nanotube Device Performance

TL;DR: In this paper, the authors present an in-depth analysis of the nanowire and nanotube device performance under process variability and show that nanowires/nanotubes are significantly less sensitive to many process parameter variations due to their inherent device structures and geometric properties.
Proceedings ArticleDOI

7.5 A 3.3ns-access-time 71.2μW/MHz 1Mb embedded STT-MRAM using physically eliminated read-disturb scheme and normally-off memory architecture

TL;DR: STT-MRAM circuit designs are presented: a short read-pulse generator with small overhead using hierarchical bitline for eliminating read disturbance, a charge-optimization scheme to avoid excessive active charging/discharging power, and ultra-fast power gating and power-on adaptive to RAM status for reducing leakage power.