S
Soichiro Handa
Researcher at Osaka University
Publications - 24
Citations - 894
Soichiro Handa is an academic researcher from Osaka University. The author has contributed to research in topics: Wavefront & Beam (structure). The author has an hindex of 9, co-authored 24 publications receiving 832 citations.
Papers
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Journal ArticleDOI
Breaking the 10 nm barrier in hard-X-ray focusing
Hidekazu Mimura,Soichiro Handa,Takashi Kimura,Hirokatsu Yumoto,Daisuke Yamakawa,Hikaru Yokoyama,Satoshi Matsuyama,Kouji Inagaki,Kazuya Yamamura,Yasuhisa Sano,Kenji Tamasaku,Yoshinori Nishino,Makina Yabashi,Tetsuya Ishikawa,Kazuto Yamauchi +14 more
TL;DR: In this paper, an in situ technique that corrects for wavefront aberrations and allows X-rays to be focused to a spot just 7 nm wide could provide a solution.
Journal ArticleDOI
Single-nanometer focusing of hard x-rays by Kirkpatrick–Baez mirrors
Kazuto Yamauchi,Hidekazu Mimura,Takashi Kimura,Hirokatsu Yumoto,Soichiro Handa,Satoshi Matsuyama,Kenta Arima,Yasuhisa Sano,Kazuya Yamamura,Koji Inagaki,Hiroki Nakamori,Jangwoo Kim,Kenji Tamasaku,Yoshinori Nishino,Makina Yabashi,Tetsuya Ishikawa +15 more
TL;DR: An at-wavelength wavefront error sensing method based on x-ray interferometry and an in situ phase compensator mirror, which adaptively deforms with nanometer precision, were developed to satisfy the Rayleigh criterion to achieve diffraction-limited focusing in a single-nanometer range.
Journal ArticleDOI
At-wavelength figure metrology of hard x-ray focusing mirrors
Hirokatsu Yumoto,Hidekazu Mimura,Satoshi Matsuyama,Soichiro Handa,Yasuhisa Sano,Makina Yabashi,Yoshinori Nishino,Kenji Tamasaku,Tetsuya Ishikawa,Kazuto Yamauchi +9 more
TL;DR: In this paper, an at-wavelength wave front metrology of a grazing-incidence focusing optical system in the hard x-ray region is developed based on numerical retrieval from the intensity profile around the focal point.
Journal ArticleDOI
Direct determination of the wave field of an x-ray nanobeam
Hidekazu Mimura,Hirokatsu Yumoto,Satoshi Matsuyama,Soichiro Handa,Takashi Kimura,Yasuhisa Sano,Makina Yabashi,Yoshinori Nishino,Kenji Tamasaku,Tetsuya Ishikawa,Kazuto Yamauchi +10 more
TL;DR: In this article, the wave field of an x-ray nanobeam was determined using an iterative algorithm using the intensity profile of a beam over a range of three orders of magnitude while its phase distribution was successfully recovered.
Journal ArticleDOI
Highly accurate differential deposition for X‐ray reflective optics
Soichiro Handa,Hidekazu Mimura,Hirokatsu Yumoto,Takashi Kimura,Satoshi Matsuyama,Yasuhisa Sano,Kazuto Yamauchi +6 more
TL;DR: In this paper, the authors developed a highly accurate differential deposition system for the fabrication of X-ray optical devices with sub-nanometer accuracy, using a Pt thin film having a thickness distribution gradually changing along the longitudinal direction on a substrate surface.