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Kenta Arima

Researcher at Osaka University

Publications -  127
Citations -  1556

Kenta Arima is an academic researcher from Osaka University. The author has contributed to research in topics: Etching (microfabrication) & Chemical-mechanical planarization. The author has an hindex of 20, co-authored 120 publications receiving 1263 citations.

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Single-nanometer focusing of hard x-rays by Kirkpatrick–Baez mirrors

TL;DR: An at-wavelength wavefront error sensing method based on x-ray interferometry and an in situ phase compensator mirror, which adaptively deforms with nanometer precision, were developed to satisfy the Rayleigh criterion to achieve diffraction-limited focusing in a single-nanometer range.
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Novel abrasive-free planarization of 4H-SiC (0001) using catalyst

TL;DR: In this article, a new abrasive-free planarization method for silicon carbide (SiC) wafers was proposed using the catalytic nature of platinum (Pt).
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Very High Carrier Mobility for High-Performance CMOS on a Si(110) Surface

TL;DR: In this paper, a flat Si(110) surface is realized by the combination of flattening processes, which include a high-temperature wet oxidation, a radical oxidation, and a five-step room temperature cleaning as a pregate-oxidation cleaning.
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Atomic-scale flattening of SiC surfaces by electroless chemical etching in HF solution with Pt catalyst

TL;DR: In this article, the authors presented a method for flattening SiC surfaces with Pt as a catalyst in HF solution, and discussed the mechanism of flattening the SiC surface with Pt.
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Catalyst‐referred etching of 4H ? SiC substrate utilizing hydroxyl radicals generated from hydrogen peroxide molecules

TL;DR: In this article, a new environmentally friendly planarization technique for 4H-silicon carbide (SiC) substrates is described, which uses hydroxyl (OH) radicals generated from hydrogen peroxide (H 2 O 2 ) molecules.