Journal ArticleDOI
Single-nanometer focusing of hard x-rays by Kirkpatrick–Baez mirrors
Kazuto Yamauchi,Hidekazu Mimura,Takashi Kimura,Hirokatsu Yumoto,Soichiro Handa,Satoshi Matsuyama,Kenta Arima,Yasuhisa Sano,Kazuya Yamamura,Koji Inagaki,Hiroki Nakamori,Jangwoo Kim,Kenji Tamasaku,Yoshinori Nishino,Makina Yabashi,Tetsuya Ishikawa +15 more
Reads0
Chats0
TLDR
An at-wavelength wavefront error sensing method based on x-ray interferometry and an in situ phase compensator mirror, which adaptively deforms with nanometer precision, were developed to satisfy the Rayleigh criterion to achieve diffraction-limited focusing in a single-nanometer range.Abstract:
We have constructed an extremely precise optical system for hard-x-ray nanofocusing in a synchrotron radiation beamline. Precision multilayer mirrors were fabricated, tested, and employed as Kirkpatrick–Baez mirrors with a novel phase error compensator. In the phase compensator, an at-wavelength wavefront error sensing method based on x-ray interferometry and an in situ phase compensator mirror, which adaptively deforms with nanometer precision, were developed to satisfy the Rayleigh criterion to achieve diffraction-limited focusing in a single-nanometer range. The performance of the optics was tested at BL29XUL of SPring-8 and was confirmed to realize a spot size of approximately 7 nm.read more
Citations
More filters
Book
X-Rays and Extreme Ultraviolet Radiation: Principles and Applications
TL;DR: In this paper, the fundamental properties of soft x-rays and extreme ultraviolet (EUV) radiation are discussed and their applications in a wide variety of fields, including EUV lithography for semiconductor chip manufacture and soft X-ray biomicroscopy.
Journal ArticleDOI
Reactivity of Surface Species in Heterogeneous Catalysts Probed by In Situ X-ray Absorption Techniques
TL;DR: (Article begins on next page)
Journal ArticleDOI
Synchrotron X-ray Analytical Techniques for Studying Materials Electrochemistry in Rechargeable Batteries
Feng Lin,Yijin Liu,Xiqian Yu,Xiqian Yu,Lei Cheng,Andrej Singer,Oleg Shpyrko,Huolin L. Xin,Nobumichi Tamura,Chixia Tian,Tsu-Chien Weng,Xiao-Qing Yang,Ying Shirley Meng,Dennis Nordlund,Wanli Yang,Marca M. Doeff +15 more
TL;DR: This article begins with the discussion of various rechargeable batteries and associated important scientific questions in the field, followed by a review of synchrotron X-ray based analytical tools and their successful applications and their fundamental insights into these scientific questions.
Journal ArticleDOI
High-resolution non-destructive three-dimensional imaging of integrated circuits
Mirko Holler,Manuel Guizar-Sicairos,Esther H. R. Tsai,Roberto Dinapoli,Elisabeth Müller,Oliver Bunk,Jörg Raabe,Gabriel Aeppli,Gabriel Aeppli,Gabriel Aeppli +9 more
TL;DR: It is demonstrated that X-ray ptychography—a high-resolution coherent diffractive imaging technique—can create three-dimensional images of integrated circuits of known and unknown designs with a lateral resolution in all directions down to 14.6 nanometres.
Journal ArticleDOI
Focusing of X-ray free-electron laser pulses with reflective optics
Hirokatsu Yumoto,Hidekazu Mimura,Takahisa Koyama,Satoshi Matsuyama,Kensuke Tono,Tadashi Togashi,Yuichi Inubushi,Takahiro Sato,Takashi Tanaka,Takashi Kimura,Hikaru Yokoyama,Jangwoo Kim,Yasuhisa Sano,Yousuke Hachisu,Makina Yabashi,Haruhiko Ohashi,Hitoshi Ohmori,Tetsuya Ishikawa,Kazuto Yamauchi +18 more
TL;DR: In this paper, the authors focus 10 keV X-ray free-electron laser radiation to an area of 0.95 µm × 1.20 µm with near-100%-efficiency using reflective optics.
References
More filters
Journal ArticleDOI
Phase retrieval algorithms: a comparison.
TL;DR: Iterative algorithms for phase retrieval from intensity data are compared to gradient search methods and it is shown that both the error-reduction algorithm for the problem of a single intensity measurement and the Gerchberg-Saxton algorithm forThe problem of two intensity measurements converge.
Journal ArticleDOI
Formation of Optical Images by X-Rays
Paul Kirkpatrick,Albert V. Baez +1 more
TL;DR: Several conceivable methods for the formation of optical images by x-rays are considered, and a method employing concave mirrors is adopted as the most promising.
Journal ArticleDOI
Breaking the 10 nm barrier in hard-X-ray focusing
Hidekazu Mimura,Soichiro Handa,Takashi Kimura,Hirokatsu Yumoto,Daisuke Yamakawa,Hikaru Yokoyama,Satoshi Matsuyama,Kouji Inagaki,Kazuya Yamamura,Yasuhisa Sano,Kenji Tamasaku,Yoshinori Nishino,Makina Yabashi,Tetsuya Ishikawa,Kazuto Yamauchi +14 more
TL;DR: In this paper, an in situ technique that corrects for wavefront aberrations and allows X-rays to be focused to a spot just 7 nm wide could provide a solution.
Journal ArticleDOI
Nanometer linear focusing of hard x rays by a multilayer Laue lens.
Hyon Chol Kang,Jörg Maser,G. B. Stephenson,Chian Liu,R. Conley,Albert T. Macrander,Stefan Vogt +6 more
TL;DR: A type of linear zone plate for nanometer-scale focusing of hard x rays, a multilayer Laue lens (MLL), produced by sectioning a multILayer and illuminating it in Laue diffraction geometry, indicates that focusing to 5 nm or smaller with high efficiency should be possible.
Journal ArticleDOI
X-ray holography
Gyula Faigel,Miklós Tegze +1 more
TL;DR: A review of holographic methods using hard x-rays is presented in this article, where the main emphasis is put on those techniques which aim to produce atomic resolution and its experimental realizations are discussed in detail.
Related Papers (5)
First lasing and operation of an ångstrom-wavelength free-electron laser
Paul Emma,R. Akre,J. Arthur,Richard M. Bionta,Christoph Bostedt,John D. Bozek,Axel Brachmann,Philip H. Bucksbaum,Ryan Coffee,F.-J. Decker,Y. Ding,David H. Dowell,S. A. Edstrom,Alan Fisher,Josef Frisch,Sasha Gilevich,Jerome B. Hastings,G. Hays,Ph. Hering,Zhirong Huang,R. H. Iverson,Henrik Loos,Marc Messerschmidt,A. Miahnahri,Stefan Moeller,Heinz-Dieter Nuhn,G. Pile,Daniel Ratner,J. Rzepiela,D. Schultz,T. Smith,P. Stefan,H. Tompkins,Joshua J. Turner,J. Welch,William E. White,Juhao Wu,Gerald Yocky,J. Galayda +38 more