Soichiro Handa

TL;DR: In this paper, an in situ technique that corrects for wavefront aberrations and allows X-rays to be focused to a spot just 7 nm wide could provide a solution.

TL;DR: An at-wavelength wavefront error sensing method based on x-ray interferometry and an in situ phase compensator mirror, which adaptively deforms with nanometer precision, were developed to satisfy the Rayleigh criterion to achieve diffraction-limited focusing in a single-nanometer range.

TL;DR: In this paper, an at-wavelength wave front metrology of a grazing-incidence focusing optical system in the hard x-ray region is developed based on numerical retrieval from the intensity profile around the focal point.

TL;DR: In this article, the wave field of an x-ray nanobeam was determined using an iterative algorithm using the intensity profile of a beam over a range of three orders of magnitude while its phase distribution was successfully recovered.

TL;DR: In this paper, the authors developed a highly accurate differential deposition system for the fabrication of X-ray optical devices with sub-nanometer accuracy, using a Pt thin film having a thickness distribution gradually changing along the longitudinal direction on a substrate surface.