Susanna K. Lynch

TL;DR: An expression for the dark-field effect in terms of the sample material's complex refractive index is obtained, which can be verified experimentally without fitting parameters.

TL;DR: A far-field, two-arm interferometer based on the new nanometric phase gratings is reported, which can detect X-ray refraction with subnanoradian sensitivity, and at the same time overcomes the fundamental limitation of ultra-narrow bandwidths of the current, most sensitive methods based on crystal interferometers.

TL;DR: In this article, multiple bilayers of x-ray transparent and opaque materials are deposited on a staircase substrate, and mostly on the floor surfaces of the steps only, and the multilayer stack on each step functions as a micro-grating whose grating period is the thickness of a bilayer.

TL;DR: It is shown that, with the appropriate design and choice of reflective phase gratings, there exist pairs of interfering pathways of exactly equal lengths independent of the incoming beam's incidence angle and wavelength.

TL;DR: A grating Bonse–Hart interferometer for phase-contrast imaging with hard X-rays overcomes limitations in the level of sensitivity and uses only phase modulating gratings, which are easier to fabricate than absorption gratings of the same periods.