T
T.P. Van Doren
Researcher at Missouri University of Science and Technology
Publications - 71
Citations - 2482
T.P. Van Doren is an academic researcher from Missouri University of Science and Technology. The author has contributed to research in topics: Electromagnetic interference & Printed circuit board. The author has an hindex of 27, co-authored 69 publications receiving 2402 citations. Previous affiliations of T.P. Van Doren include University of Missouri & Hewlett-Packard.
Papers
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Comparison of FDTD algorithms for subcellular modeling of slots in shielding enclosures
TL;DR: In this paper, two subcellular algorithms for modeling thin slots with the FDTD method are compared for application to shielding enclosures in electromagnetic compatibility (EMC), and the stability of the algorithms is investigated, and comparisons between the two methods for slots in planes, and slots in loaded cavities are made.
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FDTD modeling of common-mode radiation from cables
TL;DR: In this paper, the authors used the finite-difference time-domain (FDTD) method to model wires and cables of arbitrary radii for common-mode radiation from wires attached to printed circuit boards.
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Numerical and experimental corroboration of an FDTD thin-slot model for slots near corners of shielding enclosures
TL;DR: In this article, a finite-difference time domain (FDTD) method is employed to model thin slots in conductors for minimizing electromagnetic interference (EMI) through nonresonant length slots.
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An EMI estimate for shielding-enclosure evaluation
TL;DR: In this paper, a relatively simple, closed-form expression was developed to estimate the EMI from shielding enclosures due to coupling from interior sources through slots and apertures at the enclosure cavity modes.
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Electrodeposition and Analysis of Tin Selenide Films
TL;DR: In this article, a partir de solutions aqueuses de couches pouvant etre d'amorphes a polycristalllines. Caracterisation electrique et optique