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T.P. Van Doren

Researcher at Missouri University of Science and Technology

Publications -  71
Citations -  2482

T.P. Van Doren is an academic researcher from Missouri University of Science and Technology. The author has contributed to research in topics: Electromagnetic interference & Printed circuit board. The author has an hindex of 27, co-authored 69 publications receiving 2402 citations. Previous affiliations of T.P. Van Doren include University of Missouri & Hewlett-Packard.

Papers
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Proceedings ArticleDOI

Expert system algorithms for identifying radiated emission problems in printed circuit boards

TL;DR: In this article, a printed circuit board EMC expert system mimics the thinking processes that human EMC engineers would use to analyze circuit boards and make design recommendations, working with limited information about the enclosure, cables or the exact nature of the signals, the expert system evaluates different structures on the printed circuit boards, looking for potentially strong radiated emission sources.
Proceedings ArticleDOI

Estimating DC power bus noise

TL;DR: An approach for estimating the power bus noise spectrum is presented in this paper, where the transient current drawn by an IC device is modeled using the load current and the shoot-through current through the power dissipation capacitance.
Journal ArticleDOI

Traces in proximity to gaps in return planes

TL;DR: In this article, the effect of a gap located between and parallel to adjacent microstrip traces on the mutual inductance and mutual capacitance of a printed circuit board is investigated, and it is shown that gaps in the return plane are ineffective at reducing inductive and capacitive crosstalk in most configurations, and in some cases they increase the mutual coupling between printed circuit traces.
Proceedings ArticleDOI

An expert system for predicting radiated EMI from PCB's

TL;DR: In this article, an expert system based on symbolic reasoning techniques is proposed to predict radiated EMI levels from printed circuit boards, which does not require the user to be an expert in EMC or circuit design.
Proceedings ArticleDOI

FDTD and FEM/MOM modeling of EMI resulting from a trace near a PCB edge

TL;DR: In this article, the increase in EMI as a trace is routed increasingly closer to the PCB edge has been studied experimentally and with numerical modeling, and design maxims concerning traces near board edges are not well quantified.