T
Theodore I. Kamins
Researcher at Stanford University
Publications - 476
Citations - 20099
Theodore I. Kamins is an academic researcher from Stanford University. The author has contributed to research in topics: Silicon & Nanowire. The author has an hindex of 67, co-authored 474 publications receiving 19482 citations. Previous affiliations of Theodore I. Kamins include University of California, Los Angeles & National Institute for Nanotechnology.
Papers
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Journal ArticleDOI
A Technique for Profiling a Laser Beam and Its Application to the Recrystallization of Polysilicon Films
TL;DR: In this article, a rapid method of obtaining the intensity distribution of a cw laser beam used for the recrystallization of polysilicon has been demonstrated, which shows the importance of controlling the mode structure and, consequently, the intensity distributions of the laser beam.
Patent
Integrated circuit including single crystal semiconductor layer on non-crystalline layer
TL;DR: In this paper, a template layer incorporating an ordered array of nucleation sites is deposited on the non-crystalline surface, and the single crystal semiconductor film is formed on the nonsmalline surface from the ordered array.
Journal Article
Thermal Conductivity of Silicon/Germanium Nanostructures
H.-Y. Chang,Leonid Tsybeskov,Andrei Sirenko,David J. Lockwood,Jean-Marc Baribeau,Xiaohua Wu,M.W.C. Dharma-Wardana,Theodore I. Kamins,Alexander M. Bratkovsky +8 more
Proceedings ArticleDOI
Heavy arsenic doping of silicon by molecular beam epitaxy
TL;DR: In this article, the authors reported results of arsenic incorporation in Si molecular beam epitaxy (MBE) using a unique combination of solid (As, Si) and gas (disilane) sources to achieve these goals.
Proceedings ArticleDOI
Tensile-strained Ge/SiGe quantum-well microdisks with overlying SiN x stressors
Ming-Yen Kao,Xiaochi Chen,Yijie Huo,Colleen Shang,Muyu Xue,Kai Zang,Ching-Ying Lu,Edward T. Fei,Yusi Chen,Theodore I. Kamins,James S. Harris +10 more
TL;DR: In this article, the authors demonstrate Ge/SiGe multiple-quantum-well microdisks on Si substrates with SiN x stressors on top, and the strain transferred from the SiNx to the Ge quantum wells are determined by photoluminescence and Raman measurements, and are in agreement with simulation results.