V
V. Damodara Das
Researcher at Indian Institute of Technology Madras
Publications - 89
Citations - 1184
V. Damodara Das is an academic researcher from Indian Institute of Technology Madras. The author has contributed to research in topics: Thin film & Electrical resistivity and conductivity. The author has an hindex of 20, co-authored 89 publications receiving 1145 citations.
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Journal ArticleDOI
Size and temperature effects on the Seebeck coefficient of thin bismuth films
V. Damodara Das,N. Soundararajan +1 more
TL;DR: The electrical resistivity and the Seebeck coefficient of thermally evaporated thin bismuth films of thicknesses from 300 to 1900 A\r{} have been measured and the latter is negative and its magnitude is found to increase initially with increasing temperature, reach a maximum, and then decrease with a further rise in temperature.
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Optical and electrical investigations of indium oxide thin films prepared by thermal oxidation of indium thin films
TL;DR: In this paper, optical absorption data, optical band gap and the nature of the forbidden energy gap in the indium oxide thin films have been determined by measuring their optical absorbance as a function of wavelength.
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Electrical conductivity and thermoelectric power of amorphous Sb2Te3 thin films and amorphous-crystalline transition
TL;DR: In this paper, the results of electrical conductivity and thermoelectric studies on antimony telluride in the thin film state were reported, where vacuum-deposited on to clean glass substrates with thickness between 50 and 200 nm and studied in the temperature interval 300 to 470 K. This is attributed to an amorphous to crystalline transition, which is confirmed by X-ray diffractogram and electron diffraction patterns.
Journal ArticleDOI
Size and temperature effects on the thermoelectric power and electrical resistivity of bismuth telluride thin films.
V. Damodara Das,N. Soundararajan +1 more
Journal ArticleDOI
Thermoelectric power and electrical resistivity of crystalline antimony telluride (Sb2Te3) thin films: Temperature and size effects
V. Damodara Das,N. Soundararajan +1 more
TL;DR: In this article, the size dependence of thermoelectric power and electrical resistivity have been analyzed by the effective mean free path model of size effect, and it is found that both the thermoeellectric powers and the electrical resistivities are linear functions of the reciprocal of thickness of the films.