V
Vitaly Podzorov
Researcher at Rutgers University
Publications - 109
Citations - 12968
Vitaly Podzorov is an academic researcher from Rutgers University. The author has contributed to research in topics: Organic semiconductor & Rubrene. The author has an hindex of 45, co-authored 102 publications receiving 11854 citations. Previous affiliations of Vitaly Podzorov include Pennsylvania State University & National University of Science and Technology.
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Journal ArticleDOI
Elastomeric Transistor Stamps: Reversible Probing of Charge Transport in Organic Crystals
Vikram C. Sundar,Jana Zaumseil,Vitaly Podzorov,Etienne Menard,R. L. Willett,Takao Someya,Michael Gershenson,John A. Rogers +7 more
TL;DR: This method, which eliminates exposure of the fragile organic surface to the hazards of conventional processing, enables fabrication of rubrene transistors with charge carrier mobilities as high as ∼15 cm2/V·s and subthreshold slopes as low as 2nF·V/decade·cm2.
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Intrinsic Charge Transport on the Surface of Organic Semiconductors
Vitaly Podzorov,Etienne Menard,A. Borissov,Valery Kiryukhin,John A. Rogers,Michael Gershenson +5 more
TL;DR: The air-gap field-effect technique enabled realization of the intrinsic (not limited by static disorder) polaronic transport on the surface of rubrene (C42H28) crystals over a wide temperature range.
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High-mobility field-effect transistors based on transition metal dichalcogenides
TL;DR: In this paper, the authors report on the fabrication of field effect transistors (FETs) based on transition metal dichalcogenides (WSe2-based FETs).
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Organic single-crystal field-effect transistors
TL;DR: In this article, the intrinsic charge transport properties of organic semiconductors by using organic single-crystal field-effect transistors were investigated, and new aspects that influence charge transport in organic semiconductor FETs, and exploratory measurements in the charge density regime approaching one carrier per molecule.
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Critical assessment of charge mobility extraction in FETs
TL;DR: This work outlines some of the common pitfalls of mobility extraction from field-effect transistor (FET) measurements and proposes practical recommendations to avoid reporting erroneous mobilities in publications.