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Wolfram Wersing

Researcher at Siemens

Publications -  146
Citations -  3178

Wolfram Wersing is an academic researcher from Siemens. The author has contributed to research in topics: Ceramic & Thin film. The author has an hindex of 28, co-authored 146 publications receiving 3093 citations.

Papers
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Journal ArticleDOI

Epitaxial YBa2Cu3Ox thin films on sapphire using a Y‐stabilized ZrO2 buffer layer

TL;DR: In this paper, a c-oriented YBa2Cu3Ox thin film was deposited by dc sputtering on (1102)•sapphire substrates with an intermediate buffer layer of Y•stabilized ZrO2 (YSZ), which was grown by rf magnetron sputtering.
Patent

Device and method for detecting a substance of a liquid

TL;DR: In this paper, a mass sensor with a piezo-acoustic high-frequency thin film resonator is described, and the thickness of the pioelectric layer is in the region of 0.5 to 20 μm.
Journal ArticleDOI

Dielectric measurements on high-Q ceramics in the microwave region

TL;DR: In this article, the postresonator method proposed by Hakki and Coleman for the measurement of dielectric properties of solids in the microwave region is reexamined.
Journal ArticleDOI

On the stabilizing field of lead-titanate-zirconate ceramics doped with transition metal ions

TL;DR: In this paper, it is shown that the domain reversals are controlled by an internal bias field, but that this field does not really exist inside the ceramic grains, and a stabilization model describing the field distribution within a ceramic sample during switching is presented.
Journal ArticleDOI

Pyroelectric devices based on sputtered PZT thin films

TL;DR: In this paper, a planar multi-target sputtering process is used to deposit PZT thin films for application in pyroelectric IR sensors, which are characterized by a pyro electric coefficient p of 2-10−4 Cm−2K−1, a dielectric constant [Sgrave] of 300 and a Dielectric loss tan δ of 0.01.