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Yi-Ting Wu

Researcher at National Cheng Kung University

Publications -  10
Citations -  37

Yi-Ting Wu is an academic researcher from National Cheng Kung University. The author has contributed to research in topics: Transistor & Threshold voltage. The author has an hindex of 2, co-authored 8 publications receiving 24 citations.

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Simulation-Based Study of Hybrid Fin/Planar LDMOS Design for FinFET-Based System-on-Chip Technology

TL;DR: 3-D technology computer-aided design simulations show that the theoretical limit of BV for LDMOS can be surpassed and Hybrid FETs can be fabricated using a process flow that is compatible with the state-of-art FinFET SoC technology.
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Simulation-Based Study of High-Density SRAM Voltage Scaling Enabled by Inserted-Oxide FinFET Technology

TL;DR: In this article, a scheme for adjusting the drive strength of an inserted-oxide FinFET (iFinFET) comprising two nanowire (NW) channel regions that are separated by a thin oxide layer, to enhance the manufacturing yield of a minimally sized 6T-SRAM cell was investigated.
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Photoanode Modified by PbTiO3 or PbTiO3/TiO2 Nanofibers in Dye-Sensitized Solar Cell

TL;DR: In this article , the effect of nanofibers on the photoanode of a dye-sensitized solar cell (DSSC) was investigated by using X-ray diffractometer (XRD), electrochemical impedance spectroscopy (EIS), and incident photon current efficiency (IPCE) measurement.
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UV Enhanced Field Emission for β-Ga 2 O 3 Nanowires

TL;DR: In this article, a vapor-liquid solid growth of β-Ga2O3 nanowires (NWs) on cost-effective SiO2/Si template and the fabrication of βGa 2O3 NW field emitters was presented.
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Cell Ratio Tuning for High-Density SRAM Voltage Scaling With Inserted-Oxide FinFETs

TL;DR: In this paper, a scheme for controllably adjusting transistor drive strength in inserted-oxide FinFET (iFinFET) technology is proposed, to enable cell ratio tuning for a minimally sized six-transistor (6T) SRAM cell.