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Yun-Heub Song

Researcher at Hanyang University

Publications -  106
Citations -  679

Yun-Heub Song is an academic researcher from Hanyang University. The author has contributed to research in topics: Flash memory & NAND gate. The author has an hindex of 9, co-authored 106 publications receiving 449 citations.

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Inverse Resistance Change Cr2Ge2Te6-Based PCRAM Enabling Ultralow-Energy Amorphization.

TL;DR: This work presents an inverse resistance change PCRAM with Cr2Ge2Te6 (CrGT) that shows a high-resistance crystalline reset state and a low-Resistance amorphous set state, and demonstrates how this can break the trade-off relationship between the crystallization temperature and operating speed.
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Comparative Study on Performance of IGZO Transistors With Sputtered and Atomic Layer Deposited Channel Layer

TL;DR: The structural, chemical, and electrical properties of amorphous indium gallium zinc oxide (a-IGZO) films by magnetron sputtering and atomic layer deposition (ALD) were investigated in this paper.
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High-Performance Thin-Film Transistors with an Atomic-Layer-Deposited Indium Gallium Oxide Channel: A Cation Combinatorial Approach.

TL;DR: The effect of gallium (Ga) concentration on the structural evolution of atomic-layer-deposited indium gallium oxide (IGO) (In1-xGaxO) films as high-mobility n-channel semiconducting layers was investigated and the In.66Ga0.34O transistor was found to show the most stable behavior against an external gate bias stress.
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Statistical Characterization of Noise and Interference in NAND Flash Memory

TL;DR: The results presented here can be used to construct a channel model with data-dependent noise and interference characteristics, which in turn can be utilized in designing and evaluating advanced coding and signal processing methods for flash memory.
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Bidirectional Two-Terminal Switching Device for Crossbar Array Architecture

TL;DR: In this article, the authors proposed a bilateral switching poly-Si junction device to realize a crossbar array with a perpendicular spin-transfer torque (STT) magnetic random access memory (MRAM).