Institution
Defence Research Agency
About: Defence Research Agency is a based out in . It is known for research contribution in the topics: Synthetic aperture radar & Radar. The organization has 1211 authors who have published 1109 publications receiving 31542 citations.
Topics: Synthetic aperture radar, Radar, Silicon, Radar imaging, Alloy
Papers published on a yearly basis
Papers
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TL;DR: In this article, a new cathode-ray tube electron-gun configuration is described and compared with alternative electron guns, both traditional designs and more recent high-performance types, key features and advantages of the new approach are discussed.
Abstract: — A new cathode-ray tube electron-gun configuration is described and compared with alternative electron guns, both traditional designs and more recent high-performance types. Key features and advantages of the new approach are discussed. Three sample designs are outlined, with more detailed consideration of one typical example.
1 citations
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TL;DR: In this article, a Hall profiling technique was applied to undoped and lightly In doped MOVPE interdiffusion multilayer process (IMP) layers grown on 100 GaAs and CdTe with x values between 0.19 and 0.30 in order to investigate the parameters controlling the electrical homogeneity.
Abstract: A Hall profiling technique in which measurements are made at 77K as a function of magnetic field (0.01–1T) and layer thickness (by chemical thinning) has been developed for the characterization of Hg1−xCdxTe epitaxial layers. The technique has been applied to undoped and lightly In doped MOVPE interdiffusion multilayer process (IMP) layers grown on (100) GaAs and CdTe with x values between 0.19 and 0.30 in order to investigate the parameters controlling the electrical homogeneity. Results show unpassivated layers with x>0.25 are uniformly p-type with 77K hole concentrations consistent with Hg vacancy concentrations for the growth conditions while layers with x<0.25 are anomalous, being either inhomogeneous or uniformly n-type depending on x. The inhomogeneous layers are mainly n on p layer structures, in which the junction depth, Xj, but not the carrier concentration is found to be a function of x and can be comparable to layer thickness at x=0.20. Carrier levels in the n and p-type regions are consistent with the net background impurity donor and Hg vacancy concentrations respectively, suggesting that the n-type properties occur through post growth Hg in-diffusion filling in the vacancies. This model was partly confirmed by capping layers with CdTe, which significantly reduced the extent of the n-type region, and by ex-situ annealing experiments to simulate the inhomogeneity. Results show the low temperature process responsible for the type conversion in MOVPE CMT is highly x dependent, suggesting a variation in the electrical “Hg diffusion coefficient” of over an order of magnitude between 0.20 and 0.30 at 200°C. Carrier and mobility profiles of both as-grown and annealed n-p structures are abrupt and consistent with an interstitial Hg diffusion mechanism.
1 citations
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20 Jun 19941 citations
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TL;DR: In this article, seven aziridines and azetidines, either unsubstituted on ring nitrogen or bearing N-acyl (N, N-dimethyl carbamyl or propionyl) groups, were reacted with N2O5 in halogenated solvents with the following results: aziridine was highly dependent on the N-substituent, giving respectively dinitrate esters, nitramine-nitrate or predominantly uncharacterisable products.
Abstract: Seven aziridines and azetidines, either unsubstituted on ring nitrogen or bearing N-acyl (N,N-dimethylcarbamyl or propionyl) groups, were reacted with N2O5 in halogenated solvents with the following results:- the behaviour of the aziridines was highly dependent on the N-substituent, giving respectively dinitrate esters, nitramine-nitrate or predominantly uncharacterisable products, whereas the azetidines gave in all cases N-nitroazetidine. The different behaviour is believed to result from ring strain effects.
1 citations
Authors
Showing all 1211 results
Name | H-index | Papers | Citations |
---|---|---|---|
Stephen M. Smith | 128 | 501 | 140104 |
Jonathan Knight | 88 | 625 | 37720 |
M. S. Skolnick | 73 | 728 | 22112 |
Alan Tennant | 70 | 433 | 16870 |
Richard J. Needs | 69 | 352 | 19528 |
Dan S. Henningson | 66 | 369 | 19038 |
John Rarity | 65 | 434 | 15562 |
Michael J. Uren | 44 | 294 | 8408 |
Leigh T. Canham | 42 | 160 | 18268 |
A. G. Cullis | 40 | 161 | 11320 |
Richard A. Pethrick | 38 | 410 | 6918 |
David S. Lee | 38 | 113 | 8580 |
Neil Gordon | 37 | 181 | 37011 |
Pierfrancesco Lombardo | 36 | 301 | 5018 |
Peter John Roberts | 31 | 86 | 6679 |