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JournalISSN: 1882-6687

Ipsj Transactions on System Lsi Design Methodology 

Information Processing Society of Japan
About: Ipsj Transactions on System Lsi Design Methodology is an academic journal published by Information Processing Society of Japan. The journal publishes majorly in the area(s): High-level synthesis & Scheduling (computing). It has an ISSN identifier of 1882-6687. It is also open access. Over the lifetime, 177 publications have been published receiving 951 citations. The journal is also known as: Information Processing Society of Japan transactions on system LSI design methodology & IPSJ-SLDM.


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Journal ArticleDOI
TL;DR: It is crucial to have a flexible and holistic DRAM subsystem framework for exhaustive design space explorations, which can handle all this different types of memories, as well as the aspects of performance, power and temperature.
Abstract: In systems ranging from mobile devices to servers, Dynamic Random Access Memories (DRAM) have a big impact on performance and contributes a significant part of the total consumed power. Conventional DDR3-based solutions are stretched thin as their maximum bandwidth is limited by the I/O count and interface speed. As new solutions are coming onto the market (JEDEC DDR4, JEDEC WIDE I/O, Micron’s hybrid memory cube: HMC or JEDEC’s high bandwidth memory: HBM) it is critical to evaluate the performance of these solutions and assess their suitability for specific applications. Furthermore, in systems with 3D stacking, the challenges of high power densities and thermal dissipation are exacerbated. It is crucial to have a flexible and holistic DRAM subsystem framework for exhaustive design space explorations, which can handle all this different types of memories, as well as the aspects of performance, power and temperature.

52 citations

Journal ArticleDOI
TL;DR: A systematic and comprehensive survey on the essential issues in analytical placement, which starts by dissecting the basic structure of analytical placement and points out some research directions for future analytical placement.
Abstract: The placement problem is to place objects into a fixed die such that no objects overlap with each other and some cost metric (e.g., wirelength) is optimized. Placement is a major step in physical design that has been studied for several decades. Although it is a classical problem, many modern design challenges have reshaped this problem. As a result, the placement problem has attracted much attention recently, and many new algorithms have been developed to handle the emerging design challenges. Modern placement algorithms can be classified into three major categories: simulated annealing, min-cut, and analytical algorithms. According to the recent literature, analytical algorithms typically achieve the best placement quality for large-scale circuit designs. In this paper, therefore, we shall give a systematic and comprehensive survey on the essential issues in analytical placement. This survey starts by dissecting the basic structure of analytical placement. Then, various techniques applied as components of popular analytical placers are studied, and two leading placers are exemplified to show the composition of these techniques into a complete placer. Finally, we point out some research directions for future analytical placement.

42 citations

Journal ArticleDOI
TL;DR: This paper presents an overview and current state of research for these three promising interconnect technologies, and discusses the existing challenges for each of these technologies that remain to be resolved before they can be adopted as replacements for copper-based electrical interconnects in the future.
Abstract: In deep submicron (DSM) VLSI technologies, it is becoming increasingly harder for a copper based electrical interconnect fabric to satisfy the multiple design requirements of delay, power, bandwidth, and delay uncertainty. This is because electrical interconnects are becoming increasingly susceptible to parasitic resistance and capacitance with shrinking process technology and rising clock frequencies, which poses serious challenges for interconnect delay, power dissipation and reliability. On-chip communication architectures such as buses and networks-on-chip (NoC) that are used to enable inter-component communication in multi-processor systems-on-chip (MPSoC) designs rely on these electrical interconnects at the physical level, and are consequently faced with the entire gamut of challenges and drawbacks that plague copper-based electrical interconnects. To overcome the limitations of traditional copper-based electrical interconnects, several research efforts have begun looking at novel interconnect alternatives, such as on-chip optical interconnects, wireless interconnects and carbon nanotube-based interconnects. This paper presents an overview and current state of research for these three promising interconnect technologies. We also discuss the existing challenges for each of these technologies that remain to be resolved before they can be adopted as replacements for copper-based electrical interconnects in the future.

41 citations

Journal ArticleDOI
TL;DR: Experimental results show that a random test system based on the enhanced method of testing validity of arithmetic optimization of C compilers has higher bug detection capability than existing methods and has detected more bugs than previous method in earlier versions of GCCs and has revealed new bugs in the latest versions of gccs and LLVMs.
Abstract: This paper presents an enhanced method of testing validity of arithmetic optimization of C compilers us- ing randomly generated programs. Its bug detection capability is improved over an existing method by 1) generating longer arithmetic expressions and 2) accommodating multiple expressions in test programs. Undefined behavior in long expressions is successfully eliminated by modifying problematic subexpressions during computation of expected values for the expressions. A new method for including floating point operations into compiler random testing is also proposed. Furthermore, an efficient method for minimizing error inducing test programs is presented, which utilizes binary search. Experimental results show that a random test system based on our method has higher bug detection capability than existing methods; it has detected more bugs than previous method in earlier versions of GCCs and has revealed new bugs in the latest versions of GCCs and LLVMs.

36 citations

Performance
Metrics
No. of papers from the Journal in previous years
YearPapers
20236
20222
20213
202010
201910
20184