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Journal ArticleDOI

A method for measuring the planar interparticle distance between plate-like precipitates

K. Törrönen
- 01 Dec 1980 - 
- Vol. 13, Iss: 4, pp 329-344
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TLDR
In this paper, a method for measuring and calculating the planar interparticle distance between plate-like precipitates has been developed, which utilizes transmission electron microscopy of thin foils: no information of the volume fraction of the particles is needed.
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This article is published in Metallography.The article was published on 1980-12-01. It has received 6 citations till now. The article focuses on the topics: Volume fraction.

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Citations
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Influence of H-phase precipitation on the microstructure and functional and mechanical properties in a Ni-rich NiTiZr shape memory alloy

TL;DR: In this paper, the relationship between precipitate evolution, martensitic transformation temperatures, hardness, and functional load-bias behavior has been analyzed for a Ni50.8Ti34.2Zr15 (at%) alloy.
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Influence of Dilute Hf Additions on Precipitation and Martensitic Transformation in Ni-Ti-Pd Alloys

TL;DR: In this article, the effect of hafnium additions in Ni-Ti-Pd alloy on P-phase precipitation and martensitic transformations was studied, and it was found that the addition resulted in the refinement of precipitates with an increase in number density, and the overlapping strain fields created due to the decrease in inter-precipitate spacing are suspected to reduce the matrix volume to be less than the critical free volume size needed for the Martensitic transformation.
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Gefüge und Festigkeit metallischer Werkstoffe

TL;DR: In this article, le mecanisme elementaire de durcissement peut etre explique en considerant l'interaction entre les dislocations de glissement et certains elements microstructuraux tels que autres dislocation, defauts ponctuels, joints de grains, particules de seconde phase
References
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Electron Microscopy of Thin Crystals

TL;DR: Hirsch et al. as mentioned in this paper described further experiments on the preparation of thin film sections of embedded Backscatter Kikuchi diffraction in the SEM for identification of crystallographic thin films by electron microscopy.
Journal ArticleDOI

Dislocation movement through random arrays of obstacles

TL;DR: In this paper, the detailed movement of a dislocation line through a random array of point obstacles in the glide plane has been examined, using a digital computer, on the basis of the line tension approximation.
Journal ArticleDOI

A statistical theory of flow stress and work-hardening

TL;DR: In this article, the authors examined the impact of a random distribution of point-like obstacles to the movement of dislocations and proved that a critical applied stress exists; it is determined by a critical value of the fraction of passable obstacles such that the average dislocation segment can keep moving.
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