Proceedings ArticleDOI
A novel ferroelectric memristor enabling NAND-type analog memory characteristics
Yukihiro Kaneko,Hiroyuki Tanaka,Michihito Ueda,Yoshihisa Kato,Eiji Fujii +4 more
- pp 257-258
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TLDR
In this article, an Oxide Memory (OxiM) transistor was demonstrated as a new type of FeFET, provided with dual (top and bottom) gate, which can memorize the channel conductance with the dynamic range over 105.5 months.Abstract:
Interfacial conduction had been confirmed at the surface of ferroelectric thin film owing to the extremely high charge density over 1014 cm−2 [1]. The effect is of interest because it may be used to make a unique memristor [2] (or memistor [3]). The nonvolatile nature of memristor makes it an attractive candidate for the next-generation memory technology. Recently, we have demonstrated the conductivity modulation of the interface between two oxides, ZnO and PZT, in a ferroelectric gate field-effect transistor (FeFET) [4,5], which is applicable for a nonvolatile memory. In this study, we demonstrate an Oxide Memory (OxiM) transistor as a new type of FeFET, provided with dual (top & bottom) gate, which can memorize the channel-conductance with the dynamic range over 105. By using serially-connected OxiM transistors, we were successful in fabricating NAND memory circuit with a retention time over 3.5 months. Since the ferroelectric polarization can be modulated continuously by the gate voltage, note that multi-valued data can be memorized in an OxiM transistor. This present new transistor is implemented by all oxide-based thin films, which include SrRuO 3 (SRO: bottom gate electrode), Pb(Zr,Ti)O 3 (PZT: ferroelectric), ZnO (semiconductor), and SiON (gate insulator).read more
Citations
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Journal ArticleDOI
Multiterminal Memristive Nanowire Devices for Logic and Memory Applications: A Review
TL;DR: It is shown that trap charging dynamics can explain some of the memristive effects previously reported for Schottky-barrier field-effect Si nanowire transistors (SB SiNW FETs) and the multiterminalmemristive devices presented here have the potential of a very high integration density.
Journal ArticleDOI
Memristive behavior of plasma treated tio2 thin films
TL;DR: In this article, two layers of titania thin film were grown by the RF-magnetron sputtering technique onto silicon substrates and the surface of the first titania layer was treated by argon plasma to produce oxygen vacancies which are important for the memristive behavior.
Journal ArticleDOI
Artificial Intelligence and Advanced Materials
TL;DR: A review of the origins, procedures, and applications of artificial intelligence can be found in this paper , where ML and its methods are reviewed to provide basic knowledge of its implementation and its potential.
Journal ArticleDOI
Memristor Effect in Sandwich-Type Ni-TiOx-p/Si-Ni Heterojunction
Oleksandr M. Kostiukevych,Valeriy A. Skryshevsky,Vasyl V. Lendiel,Yuriy G. Shulimov,A.I. Manilov,Oleksandr Ye. Lushkin +5 more
TL;DR: In this article, the Ni-TiOx-p/Si-Ni heterojunction was studied under different speeds of voltage sweep, in darkness and under illumination of various spectral regions.
Dissertation
Unconventional Computing Using Memristive Nanodevices: From Digital Computing to Brain-like Neuromorphic Accelerator
TL;DR: This thesis introduces novel high performance architectures for next generation computing using emerging nanotechnologies such as memristors and develops a Neural Network Scalable Spiking Simulator suitable for the hardware implementation of neuromorphic computation.
References
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Journal ArticleDOI
Surface conduction on insulating BaTiO3 crystal suggesting an intrinsic surface electron layer
TL;DR: The observations suggest a two-dimensional electron on a clean, free ferro electric surface that may be regarded as a ferroelectric metal.
Journal ArticleDOI
Nonvolatile Memory Using Epitaxially Grown Composite-Oxide-Film Technology
TL;DR: In this article, a ferroelectric-gate field effect transistor (FeFET) composed of heteroepitaxially stacked oxide materials was developed, where a semiconductor film of ZnO, a PZT film of Pb(Zr,Ti)O3 (PZT), and a bottom gate electrode of SRO (SrRuO3) was grown on a SrTiO3 substrate.