Proceedings ArticleDOI
A Simulator of Small-Delay Faults Caused by Resistive-Open Defects
Alejandro Czutro,Nicolas Houarche,P. Engelke,Ilia Polian,Mariane Comte,Michel Renovell,Bernd Becker +6 more
- pp 113-118
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TLDR
This work couple the calculation of the critical size of a small-delay fault with the computation of the resistance range of the corresponding resistive-open defect for which this size is exceeded, and is able to extend probabilistic fault coverage metrics initially developed for static resistive bridging faults to small- delay defects.Abstract:
We present a simulator which determines the coverage of small-delay faults, i.e., delay faults with a size below one clock cycle, caused by resistive-open defects. These defects are likely to escape detection by stuck-at or transition fault patterns. For the first time, we couple the calculation of the critical size of a small-delay fault with the computation of the resistance range of the corresponding resistive-open defect for which this size is exceeded. By doing so, we are able to extend probabilistic fault coverage metrics initially developed for static resistive bridging faults to small-delay defects.read more
Citations
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GPU-Accelerated Simulation of Small Delay Faults
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GPU-accelerated small delay fault simulation
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References
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