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Amorphous-Crystalline Transitional Effect on the Optical Behavior of Se80Te20 Thin Films

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TLDR
In this paper, optical properties of amorphous Se80Te20 alloys with thickness around 250 nm were prepared by vacuum deposition and as-grown films were annealed in an Argon atmosphere as a function of temperature and time.
Abstract
Thin films of amorphous Se80Te20 alloys with thickness around 250 nm were prepared by vacuum deposition. The as-grown films were annealed in an Argon atmosphere as a function of temperature and time. Optical characterization of the films through various degrees of crystallinity was done in order to estimate the influence of the heat treatment on the optical properties of the thin films. The optical constants of all films, viz., refractive index (n), extinction coefficient (k), absorption coefficient (α) and band gap (Eg) were calculated from the transmission spectra recorded in the wavelength region 400–1900 nm. For the asdeposited films, Eg is found to be 1.5 eV. It is found that the values of Eg are sensitive to theannealing temperature and it increases with increase in temperature. The reasons for the observed variation of optical properties with annealing temperatures are discussed. Also, the different stages of crystallinity were identified using transmission electron microscopy (TEM). It is...

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Journal ArticleDOI

Observation of Dielectric Peaks in Glassy Se70Te20Sn10 Alloy

TL;DR: In this article, temperature and frequency dependences of the dielectric constants and Dielectric loss were studied in Glassy Se70Te20Sn10 Alloy in the audio-frequency range below the glass transition region.
References
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Electronic processes in non-crystalline materials

TL;DR: The Fermi Glass and the Anderson Transition as discussed by the authorsermi glass and Anderson transition have been studied in the context of non-crystalline Semiconductors, such as tetrahedrally-bonded semiconductors.
Journal ArticleDOI

Dispersive optical constants of amorphous Se1−xTex films

TL;DR: In this article, optical constants of amorphous Se1−xTex films have been measured for 0.45 µm at wavelengths from 0.35 to 2 µm using both an ellipsometer and a spectrophotometer.
Journal ArticleDOI

Photocrystallization in amorphous thin films of Se100−xTex

TL;DR: In this article, a systematic study of photocrystallization in a-Se100−xTex films (0 ⩽ x ⌽ 25) was performed and it was shown that photocrystization is highly composition dependent.
Journal ArticleDOI

Amorphous to crystalline phase transformation and growth of thin Te‐Se films

TL;DR: In this paper, it is proposed that crystal growth takes place by the addition of small segments of extended homogeneous chains of either Te or Se atoms onto specific low energy crystallographic planes.
Journal ArticleDOI

Studies of structural relaxation and crystallization kinetics of Se X Te1−X amorphous system by DTA measurements

TL;DR: Differential thermal analysis studies of the binary system SeXTe1−X are reported and the phenomena accompanying the temperature-induced changes in amorphous samples are discussed in this article, where the enthalpy of crystallization of the samples is calculated from DTA measurements.
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