Journal ArticleDOI
An accurate and repeatable technique for noise parameter measurements
A. Boudiaf,M. Laporte +1 more
- Vol. 42, Iss: 2, pp 532-537
TLDR
In this paper, a homemade automated noise parameter measurement system is described, and a new algorithm for the estimation of the two-port noise parameters is presented, by taking into account the measurement uncertainties.Abstract:
In spite of the improvements in RF instrumentation, network analyzer calibration methods, and measurement techniques, the measurement of noise parameters in highly mismatched systems is particularly prone to error. A homemade automated noise parameter measurement system is described, and a new algorithm for the estimation of the two-port noise parameters is presented. Analytical calculation of the parameter accuracy is developed, by taking into account the measurement uncertainties. The accuracy and the repeatability of the measurements performed with a low-noise HEMT are presented. >read more
Citations
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Journal ArticleDOI
Evaluation of Tuner-Based Noise-Parameter Extraction Methods for Very Low Noise Amplifiers
Leonid Belostotski,J.W. Haslett +1 more
TL;DR: In this paper, the authors compared the performance of source-tuner noise-parameter extraction methods used to measure noise parameters of low-noise amplifiers that have very low (1 dB) noise figures.
Journal ArticleDOI
Low-Noise Microwave Performance of AlN/GaN HEMTs Grown on Silicon Substrate
TL;DR: In this paper, the performance of state-of-the-art AIN/GaN high-electron-mobility transistors (HEMTs) grown on 100mm Si substrate has been investigated.
Journal ArticleDOI
Novel Noise Parameter Determination for On-Wafer Microwave Noise Measurements
TL;DR: A novel method to determine the noise parameters of receivers or devices under test (DUTs) for on-wafer microwave noise measurements is presented, and fast convergence is achieved by the proposed impedance selection principle.
Journal ArticleDOI
Verification of on-wafer noise parameter measurements
TL;DR: In this paper, the authors have designed and fabricated a new passive device for noise parameter measurement test instrumentation verification using thin film technology, which is suitable for on-wafer measurements due to its small size and wide operation bandwidth.
Journal ArticleDOI
Sub-1-dB Minimum-Noise-Figure Performance of GaN-on-Si Transistors Up to 40 GHz
Farid Medjdoub,Y. Tagro,Malek Zegaoui,B. Grimbert,Francois Danneville,Damien Ducatteau,Nathalie Rolland,Paul-Alain Rolland +7 more
TL;DR: In this paper, the millimeter-wave noise performance of AlN/GaN/AlGaN double heterostructure (DHFET) grown on a 100mm Si substrate with low-noise properties up to 40 GHz was reported.
References
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Journal ArticleDOI
Least-squares fitting of a straight line
TL;DR: In this article, an efficient method for computing the best straight line by least squares when there are statistical errors in both coordinates is given, and exact expressions for the variances of the slo...
Journal ArticleDOI
An efficient method for computer aided noise analysis of linear amplifier networks
H. Hillbrand,Peter Russer +1 more
TL;DR: In this paper, a two-port noise analysis based on correlation matrices is presented. But the correlation matrix concept holds two main advantages over other methods of noise analysis: it can be treated without any loss of efficiency and information concerning minimum noise figure and noise matching conditions is obtained.
Journal ArticleDOI
The determination of device noise parameters
TL;DR: In this paper, a novel noise measurement technique is outlined which results in data that directly gives the noise parameters of the test device when processed by a simple computer program, which can be used to estimate the noise of a test device.
Journal ArticleDOI
An Improved Computational Method for Noise Parameter Measurement
M. Mitama,H. Katoh +1 more
TL;DR: In this paper, the authors proposed a method for measuring the noise parameters of a gate-length GaAs MESFET (NE38806) for linear noisy two-ports by introducing a computational method for evaluating measured admittance errors.
Journal ArticleDOI
Computer-Aided Determination of Microwave Two-Port Noise Parameters
C. Giuseppe,M. Sannino +1 more
TL;DR: In order to apply the least-squares fit of measured noise figures as a function of source admittance to microwave two-ports, a relationship relating noise parameters in a linearized form is introduced.