Journal ArticleDOI
An Evaluation of the Prism Coupler for Measuring the Thickness and Refractive Index of Dielectric Films on Silicon Substrates
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This article is published in Journal of The Electrochemical Society.The article was published on 1979-09-01. It has received 39 citations till now. The article focuses on the topics: Prism coupler & Refractive index profile.read more
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Journal ArticleDOI
Measuring refractive index and thickness of thin films: a new technique
Tie-Nan Ding,Elsa Garmire +1 more
TL;DR: By exciting these leaky waves through the substrate, this work has demonstrated a convenient and accurate method of measuring both the refractive index and thickness of thin films.
Journal ArticleDOI
Optical constants of Titan tholins at mid-infrared wavelengths (2.5–25 μm) and the possible chemical nature of Titan’s haze particles
Hiroshi Imanaka,Hiroshi Imanaka,Dale P. Cruikshank,B. N. Khare,B. N. Khare,Christopher P. McKay +5 more
TL;DR: In this paper, the optical constants of Titan tholins generated with cold plasma irradiation of a N 2 /CH 4 (90/10) gas mixture at pressures of 0.26, 1.6, and 23 mmbar were obtained.
Journal ArticleDOI
Determination of the refractive index of InGaAsP epitaxial layers by mode line luminescence spectroscopy
TL;DR: In this article, a method of detecting optical waveguide modes of semiconductor epitaxial layers is presented, where the modes are excited by photoluminescence and coupled out of the semiconductor wafer by a grating etched on the surface of the guiding layer.
Journal ArticleDOI
Novel thin films of titanium dioxide particles synthesized by a sol-gel process
TL;DR: In this paper, thin films of ultrafine titanium dioxide particles dispersed in a matrix of hydroxypropylcellulose (HPC) polymer have been made on quartz and silicon substrates.
Journal ArticleDOI
Polymer Optical Interconnects—A Scalable Large-Area Panel Processing Approach
S. Uhlig,L. Frohlich,Miaoxiang Chen,N. Arndt-Staufenbiel,G. Lang,H. Schroder,Ruth Houbertz,Michael Popall,Mats Robertsson +8 more
TL;DR: In this article, a flexible approach to produce optical interconnects on 6096 $ast,$6096 mm large-area panels is demonstrated, where waveguide routing design allows optical waveguides on different 1016$ast,$ 1016 mm tiles to be interconnected and four different waveguide connecting geometries in the border region between tiles are fabricated and tested.
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