Journal ArticleDOI
Analogue circuits fault dictionary. New approaches and implementation
P. M. Lin,Y. S. Elcherif +1 more
TLDR
In this article, the authors present the use of several techniques to enhance the capability of the d.c. fault dictionary for diagnosing hard failures (open circuits and short circuits) in non-linear analogue circuits.Abstract:
The d.c. fault dictionary approach has been found very useful for diagnosing hard failures (open circuits and short circuits) in non-linear analogue circuits. In this paper we present the use of several techniques to enhance the capability of the d.c. fault dictionary. These include (1) modelling all non-linearities by piecewise linear characteristics, (2) solving the piecewise linear resistive network by Lemke's complementary pivot algorithm, (3) using multilevel logic operation to compile an integer-code fault dictionary which totally eliminates any post-test calculations. the automatic generation of a fault dictionary for a video amplifier by the use of the computer program HAFDIC is described.read more
Citations
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Proceedings ArticleDOI
A design-for-test methodology for active analog filters
TL;DR: A DFT (design-for-test) methodology to improve the controllability/observability of internal signals in active filters is presented, which is suitable for silicon compiler and CAD (computer-aided-design) implementation.
Journal ArticleDOI
Entropy-based optimum test points selection for analog fault dictionary techniques
TL;DR: An efficient method to select an optimum set of test points for dictionary techniques in analog fault diagnosis by searching for the minimum of the entropy index based on the available test points by using an integer-coded dictionary.
Journal ArticleDOI
Selection of test nodes for analog fault diagnosis in dictionary approach
V.C. Prasad,N.S.C. Babu +1 more
TL;DR: Polynomial time algorithms are proposed in this paper for the first time to generate minimal set of test nodes in analog circuit fault diagnosis and they are much faster than well-known methods.
Proceedings ArticleDOI
Physical planning with retiming
Jason Cong,Sung Kyu Lim +1 more
TL;DR: A unified approach to partitioning, floorplanning, and retiming for effective and efficient performance optimization is proposed and GEO obtains 35% and 23% better delay results while maintaining comparable cutsize, wirelength, and runtime results.
Proceedings ArticleDOI
An experimental approach to analog fault models
TL;DR: In this paper, a comprehensive approach to model faults in analog circuits and systems based on experimental statistics of manufacturing defects is presented, and a case study based on a simple sample-and-hold circuit is discussed with specific results.
References
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Journal ArticleDOI
A dc approach for analog fault dictionary determination
W. Hochwald,J. Bastian +1 more
TL;DR: In this article, the authors examined actual field failure statistics and identified which of these field failures could realistically have been predetermined and modeled by the dc approach, and made an estimate of the percent of actual field failures that can be detected and isolated by the DC approach.
Journal ArticleDOI
Fault diagnosis for linear systems via multifrequency measurements
TL;DR: In this paper, the fault diagnosis problem for a linear system whose transfer function matrix is measured at a discrete set of frequencies is formalized and a measure of solvability for the resultant equations and a testability measure for the unit under test is developed.
Journal ArticleDOI
Node-fault diagnosis and a design of testability
TL;DR: A concept of k-node-fault testability is introduced and a sufficient and almost necessary condition for testability as well as the test procedure is presented, which depends only on the graph of the circuit, not on the element values.
Journal ArticleDOI
Conditions for Network-Element-Value Solvability
TL;DR: In this paper, the concept of network-element-value solvability is introduced and its importance in the establishment of methods of automatic trouble-shooting of electronic equipment is pointed out.