Patent
Full-fiedl correction method for laser scanning cofocal microscope scanning distortion phenomenon
TLDR
In this paper, the authors used standard raster specimen, using LSCM scanning moire method to obtain scan moire image, to proceed four steps phase shift processing to originality image though moire phase shift technology to obtain phase map, after unpackaging to obtain originality phase map according to phase and displacement field relation to obtain scanning perturbed field.Abstract:
The present invention adopts standard raster specimen, using LSCM scanning moire method to obtain scanning moire image, to proceed four steps phase shift processing to originality image though moire phase shift technology to obtain phase shift moire image, according to moire phase shift theory to obtain phase map, after unpackaging to obtain originality phase map, according to phase and displacement field relation to obtain scanning perturbed field, thereby reaching correction target. Compared with current method, the present invention can directly measure scan line perturbed field resulted from scanning control unit distortion phenomena through scanning moire and moire phase shift technology , with high precision, simple operation, and real time and all field measurement.read more
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Patent
Four-step phase shifting method based on absolute phase recovery
TL;DR: In this article, a four-step phase shifting method based on n absolute phase recovery is presented. But the method does not need to individually project additional absolute phase identifier images in the methods, and the number of the required images is few.
Patent
Unwarping phase error detection and correction method based on uncertainty of fringe order
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Patent
Film thickness error correction method based on surface coating confocal microtopography measuring device
TL;DR: In this paper, a film thickness error correction method based on a surface coating confocal microtopography measuring device is proposed, which consists of calculating the normalization result of the axial response curve data of a maximum-gradient point and rest points on the basis of obtaining the three-dimensional topography of a coated sample to be tested, fitting by virtue of sinc (a(x-b)) as an objective function, performing convolution operation on the fitting result of a minimum residual error function, next, performing difference operation, and complementing the film thickness by using